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Sample preparation method for improving detection sensitivity of surface-enhanced laser-induced breakdown spectroscopy

A laser-induced breakdown and spectral sensitivity technology, which is applied in the field of ion emission spectroscopy detection, can solve the problems of high activity ions not being applicable, achieve the effects of lowering the detection limit, improving the LIBS spectral intensity, and strong universality

Inactive Publication Date: 2019-04-02
ANHUI NORMAL UNIV
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Problems solved by technology

However, the method of chemical replacement is only suitable for inert metal ions, and is not suitable for other highly active ions

Method used

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  • Sample preparation method for improving detection sensitivity of surface-enhanced laser-induced breakdown spectroscopy
  • Sample preparation method for improving detection sensitivity of surface-enhanced laser-induced breakdown spectroscopy
  • Sample preparation method for improving detection sensitivity of surface-enhanced laser-induced breakdown spectroscopy

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specific Embodiment 1

[0024] figure 2 Shown is the relationship curve between the number of in-situ sample preparations obtained by the method of the present invention and the intensity of the emission spectrum of the element. As shown in the figure, the spectral intensities of the four heavy metal elements increase with the number of in-situ sample preparations.

[0025] image 3 Shown is the relationship curve between the number of in-situ sample preparation and element detection limit obtained by the method of the present invention. As shown in the figure, the detection limit (LoD) of each element decreases with the increase of sample preparation times.

[0026] To sum up, with multiple in-situ sample preparations, as the number of sample preparations increases, the spectral intensity of the analyte elements increases and the detection limit decreases. When the number of sample preparations is ≥4 times, the detection limits of heavy metal elements Cu, Pb, Cd and Cr can be improved to 0.033, ...

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Abstract

The invention discloses a sample preparation method for improving the detection sensitivity of surface-enhanced laser-induced breakdown spectroscopy. The method utilizes in situ multiple sample preparation to assist the surface-enhanced laser-induced breakdown spectroscopy (SENLIBS) technique, that is, the droplets to be tested are dropped several times and dried in a circular analysis layer prepared for the first time, thereby increasing the concentration of an element to be tested in the fixed area, improving the spectral intensity of a target element, reducing the detection limit of the element to be measured by the SENLIBS technique, and improving the detection sensitivity of the SENLIBS technique. Compared with the existing sample preparation method of the SENLIBS technique, the method has the advantages of requiring no additional extraction reagents to assist, simple sample preparation process, requiring no professional operation, sample preparation of full-element and high universality.

Description

technical field [0001] The invention belongs to the technical field of plasma emission spectrum detection, and in particular relates to a sample preparation method for improving the detection sensitivity of surface-enhanced laser-induced breakdown spectrum. Background technique [0002] Surface-enhanced laser-induced breakdown spectroscopy (SENLIBS for short) is a new method for LIBS to detect liquids. This technology was first proposed by M. A. Aguirre et al. (Spectrochimica Acta Part B: Atomic Spectroscopy, 2013. 79-80(3): 88-93), which used liquid-liquid extraction technology as a pretreatment method for manganese chloride, and 10 μL of the extract was dried and detected on the surface of the aluminum substrate, which enhanced the spectral intensity of Mn by 50 times compared with the droplet method, and the detection limit of Mn could reach 6 μg / mL. However, the sensitivity of this technique has not yet reached the ideal value. [0003] To this end, X.Y. Yang et al. (O...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/71G01N1/34
CPCG01N1/34G01N21/718
Inventor 杨新艳崔执凤姚关心郑贤锋盛晓伟黄静春刘小明俞硕周正仙
Owner ANHUI NORMAL UNIV
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