Unlock instant, AI-driven research and patent intelligence for your innovation.

A Delay Chain Structure to Overcome Timing Deviations of Chips under Different Process Angles

A technology of timing deviation and process angle, applied in the field of delay chain, can solve problems such as process influence, achieve the effect of improving structural quality and meeting requirements

Active Publication Date: 2020-08-11
SHENZHEN YILIAN INFORMATION SYST CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, units are mainly used to meet the delay requirements, but the delay ratio of FF / SS under different process angles reaches 1:3, which is seriously affected by the process and cannot meet the demand.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Delay Chain Structure to Overcome Timing Deviations of Chips under Different Process Angles
  • A Delay Chain Structure to Overcome Timing Deviations of Chips under Different Process Angles

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] In order to fully understand the technical content of the present invention, the technical solutions of the present invention will be further introduced and illustrated below in conjunction with specific examples, but not limited thereto.

[0018] Such as Figure 1 to Figure 2 The specific embodiment shown is a delay chain structure that overcomes timing deviations of chips at different process angles, including several delay units 10, and adjacent delay units 10 are connected by delay lines 20; the delay lines 20 is a return type wiring.

[0019] Wherein, the delay unit 10 is a buffer whose drive is 8 times.

[0020] Wherein, the delay line 20 is a second-layer metal line, and its resistance is relatively large, which can generate a relatively large line delay, thereby meeting the requirements.

[0021] Wherein, the length of the delay line 20 is 200-400um.

[0022] Further, in this embodiment, the length of the delay line 20 is 300um, which can better meet the requ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a delay chain structure for overcoming a timing sequence deviation of a chip under different process angles. The delay chain structure comprises a plurality of delay units, wherein adjacent delay units are connected by a delay line; and the delay line is a hollow square line. The delay chain structure provided by the invention improves the quality of the delay chain structure, so that it is not affected by the process deviation and can better meet the demands.

Description

technical field [0001] The invention relates to the technical field of delay chains, and more specifically refers to a delay chain structure for overcoming timing deviations of chips at different process angles. Background technique [0002] As the chip process enters deep sub-micron, especially 28nm, the short channel effect (SCE) caused by the shortening of the transistor channel makes the chip in SS (slow process corner) / TT (normal process corner) / FF (fast process corner) Angle) The deviation increases sharply under the process. [0003] At present, units are mainly used to meet the delay requirements, but the delay ratio of FF / SS under different process angles reaches 1:3, which is seriously affected by the process and cannot meet the demand. Contents of the invention [0004] The purpose of the present invention is to overcome the defects of the prior art, and provide a delay chain structure that overcomes timing deviations of chips under different process angles...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/528G06F30/392
Inventor 袁庆李华东董建国徐军
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD