Method based on transmission electron microscope common sample table for loading two samples at same time

Abstract

The invention belongs to the technical field of transmission electron microscopes and discloses a method based on a transmission electron microscope common sample table for loading two samples at thesame time. The method includes: according to different characteristics of pre-test materials, selecting a proper TEM supporting film carrying net, and dispersing a powder sample onto the supporting film carrying net according to a conventional powder sample preparation method for testing; using a blade to cut the carrying film with a prepared sample in halves; utilizing a self-made TEM sample transfer tool to respectively transfer two samples obtained by cutting to left and right sides or upper and lower sides of the sample table, and recording respective corresponding positions; putting the sample table into a TEM, and testing after vacuum reaches testing requirements. The number of sample changing times of the TEM is reduced effectively, time consumption for sample changing and vacuum waiting is reduced, testing efficiency is improved, and testing cost is lowered; the method is good for stability of the sample in an electron microscope, thereby being conducive to acquiring of high-resolution images, and also good for stable running and maintaining of instrument equipment.

Description

technical field [0001] The invention belongs to the technical field of transmission electron microscopy, in particular to a method for simultaneously loading two samples based on a common sample stage of a transmission electron microscope. Background technique [0002] At present, the existing technologies commonly used in the industry are as follows: [0003] Transmission electron microscopy (TEM for short) can provide information on microscopic morphology, structure, and composition of various micro- and nano-scale materials, so it has been widely used in materials, physics, chemistry, biology, information, geology, aerospace, etc. Many disciplines have greatly promoted the development of nanotechnology. With the development of science and technology, the continuous updating of TEM technology, the reduction of cost, and the country's emphasis on science and technology, there have been more and more TEMs in domestic universities and research institutes in recent years. Ta...

AI Technical Summary

Problems solved by technology

[0007] (1) When the ordinary sample stage of the transmission electron microscope in the prior art is testing the powder sample, because the test content is relatively simple and the time is short, it often needs to change the sample frequently, thereby increasing the time of the test (time for frequent sample replacement) cost; at the same time It also increases the risk of damage to components such as the sample table angle measuring table and vacuum ball valve, which is not conducive to the stable operation and maintenance of the equipment;

[0008] (2) At present, the multi-position sample table only has the function of single tilt, so it cannot meet the requirements for the structural analysis that requires tilting different belt axes

[0010] (1) Difficulty: If you want to solve the problem of placing multiple samples to be tested at one time on the ordinary sample stage of TEM and retaining the double-tilt function of the sample stage, you will first face the problem of narrow space between the sample stage of TEM and the pole piece of the objective lens. If the length of the stage is used to obtain more sample position space, the double-tilt function of the sample will be lost, that is, it is difficult to have both multi-position samples and double-tilt function

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