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A system and method for measuring upper limit of scintillator response based on electron beam current

A technology of electron beam current and measurement system, which is applied in the direction of radiation measurement, measurement device, X/γ/cosmic radiation measurement, etc., can solve the problems of poor stability, poor repeatability, uncertainty of measurement results, etc., and achieve system setting The effect of simplicity and simple calculation process

Active Publication Date: 2020-10-09
NORTHWEST INST OF NUCLEAR TECH
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  • Application Information

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Problems solved by technology

The former is mainly used in the deep ultraviolet and soft X-ray bands, but this scheme cannot be applied to MeV electrons and γ-rays; the latter is limited by the poor stability of the pulsed high-current X-ray source device, and the uncertainty of the measurement results is high , poor repeatability and other issues, and cannot meet the actual needs of use

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  • A system and method for measuring upper limit of scintillator response based on electron beam current
  • A system and method for measuring upper limit of scintillator response based on electron beam current
  • A system and method for measuring upper limit of scintillator response based on electron beam current

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Embodiment Construction

[0030] The present invention will be described in more detail below by means of the accompanying drawings and examples.

[0031] Such as figure 1 As shown, a scintillator response upper limit measurement system based on electron beam current, including electron linear accelerator, scintillator chamber, photocell and oscilloscope;

[0032] The scintillator chamber is made of iron material, and includes a main chamber and at least one side chamber communicated with the main chamber. The scintillator to be tested is installed in the main chamber, and a photoelectric cell is installed in the side chamber or at the outlet position. When there are two side chambers, two photoelectric cells can be used (one photoelectric cell is used in this example).

[0033] The electron beam emitted by the electron linear accelerator is irradiated on the scintillator to be tested to excite the optical signal, the optical signal is received by the photoelectric tube and converted into an electrica...

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Abstract

The invention relates to an electron-beam-current-based scintillator response upper limit measurement system and method. According to the principle, electric charge quantities of bunch electron beamsare adjusted based on electron beam currents generated by an electron linear accelerator and thus photoyields of a scintillator under different electric charge quantities are measured; and on the basis of a linear relationship between the scintillator photoyields and the electric charge quantities of bunch electron beams, a linear range and an upper response limit of the scintillator applied to pulse measurement are determined. According to the invention, a novel concept is provided for measuring the upper response limit of the scintillator; and the blank of the related measuring method is filled. Meanwhile, the system works stably; and parameters like the electric charge quantity of the bunch electron beam can be adjusted. Since the energy is the monoenergetic one, the response to different energy electrons does not need to be considered; and the measurement accuracy is high.

Description

technical field [0001] The invention relates to an electron beam current-based scintillator response upper limit measurement system and method. Background technique [0002] Scintillators are widely used for measurements such as gamma, X-rays, and charged particles. Studies have shown that the light emitted by scintillators excited by γ, X-rays and other charged particles is not completely proportional to the absorbed energy, and the deviation of the linear relationship between luminous intensity and absorbed energy is called nonlinear. [0003] When scintillators are used in the measurement of pulsed radiation, it is generally believed that the light yield is proportional to the intensity of the pulsed radiation, so that the intensity information of the pulsed radiation can be obtained through the light yield of the scintillator. However, as the pulse intensity increases, the light yield of the scintillator will deviate from linearity, and even radiation damage will occur....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T7/00G01T1/202G01T1/203
CPCG01T1/202G01T1/2033G01T7/005
Inventor 魏坤翁秀峰谭新建黑东炜盛亮李斌康刘军孙彬付竹明
Owner NORTHWEST INST OF NUCLEAR TECH