Spin Effect Microelectronics Integrated Test Bench

Abstract

The invention discloses a spin effect microelectronics integrated test bench, which includes a sample stage which is in a steady magnetic field and rotates around a horizontal axis, and the sample stage includes a measuring unit for measuring the electrical signal of a sample, for A microwave unit is formed at the sample to excite it to generate a microwave field of spin flow, and a heating unit is used to establish a temperature gradient in a direction perpendicular to the sample plane. The present invention does not need to re-sample, and performs multiple measurements on various spin-effect related parameters in the same sample, saving measurement time, and can also apply DC current, microwave and temperature gradient to the sample at the same time to measure the relationship between various parameters. mutual coupling effect.

Description

technical field [0001] The invention relates to an integrated test bench for testing the spin correlation effect of a material sample of a microelectronic device, in particular to a microelectronic device for measuring the spin Hall magnetoresistance effect, spin Seebeck and spin current of a material sample Integration test bench. Background technique [0002] With the development of microelectronic devices, the problem of heat dissipation has become a bottleneck in the development of microelectronics. One possible solution to this heat dissipation problem is to exploit the spin of electrons, or spintronics. In spintronics, pure spin current can be used to replace current to transmit information, and there is no Joule heat in the transmission process of spin current, which can greatly reduce the heat dissipation of the device. In order to use the electron spin of the material to design devices, it is necessary to select a suitable electron spin effect material that satisf...

AI Technical Summary

Problems solved by technology

Existing measurement schemes cannot accurately detect pure spin current, and the physical mechanisms of various effects are different but organically related, but because there is no corresponding test bench to achieve simultaneous measurement, this leads to the need for multiple samples in multiple measurements This process will bring certain errors, and the efficiency of multiple tests is also very low.

To test the above multiple physical quantities at the same time will face many difficulties. For example, the positions of the waveguide and the test bench carrying the sample are relatively fixed when testing pure spin current, but a test bench is required when measuring spin Hall magnetoresistance The included angle with the external magnetic field is variable; another example is to test the spin Hall magnetoresistance or the pure spin current excited by microwaves, it is necessary to fix the material sample on the insulating plate and connect it to the circuit electrode, but due to the thermal conductivity of the insulating plate low, thus limiting the possibility of applying large temperature gradients in the vertical direction, and cannot be used to test the spin Seebeck effect

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