Solar cell defect detection method integrating short-time and long-time depth characteristics

A technology of solar cell and depth feature, applied in the field of solar cell defect detection, can solve the problems of insufficient detection accuracy, small calculation amount, detection efficiency, poor versatility, etc. The effect of high detection efficiency

Active Publication Date: 2019-09-10
ZHENGZHOU UNIVERSITY OF LIGHT INDUSTRY
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Problems solved by technology

[0004] Aiming at the technical problems of poor versatility and insufficient detection accuracy of existing detection methods that simply use current image observation information or purely use prior knowledge, this invention proposes a solar cell defect detection method that combines short-term and long-term depth features , which effectively uses the deep features that fuse the current image observation information and prior knowledge to characterize the defects of solar cells, which can significantly improve the versatility and accuracy of single crystal silicon solar cell defect detection, and has a small amount of calculation and high detection efficiency

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  • Solar cell defect detection method integrating short-time and long-time depth characteristics

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[0076] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0077] Such as figure 1 As shown, a kind of solar cell sheet defect detection method of the present invention fusion short-term and long-term depth features, its steps are as follows:

[0078] Step 1: Preprocessing: Preprocessing a frame of three-channel color images of solar cells to be detected by means of image scaling, grayscale, median filtering, and grid line deletion to eliminate irrelevant information in the image; reduce image The impurity background...

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Abstract

The invention provides a solar cell defect detection method integrating short-time and long-time depth characteristics. The method comprises the following steps: preprocessing; performing short-time depth feature extraction, including blocking and vectorizing the preprocessed images and then sending the images into a stacked noise reduction automatic encoder to be trained; obtaining a two-dimensional adaptive depth feature matrix learned by all image blocks, and converting the two-dimensional adaptive depth feature matrix into a three-dimensional matrix to obtain a short-time depth feature composed of current image observation information; extracting long-time depth features; integrating and converting the short-time depth feature and the long-time depth feature; and performing low-rank matrix decomposition and post-processing to obtain a final detection result. According to the method, the defect of the solar cell is characterized by using the depth characteristics fusing the currentimage observation information and the priori knowledge, so that the universality and accuracy of the defect detection of the solar cell can be remarkably improved, the calculation amount is small, thedetection efficiency is high, and the positioning precision is relatively high.

Description

technical field [0001] The invention relates to the technical field of solar cell defect detection, in particular to a solar cell defect detection method that combines short-term and long-term depth features. Background technique [0002] In recent years, facing the problems of environmental degradation and energy shortage, the use of renewable energy such as solar energy to generate electricity has become a key technical means to solve this problem, and as the key equipment of solar photovoltaic power generation systems, the quality of solar cells has a great has far-reaching consequences. Therefore, it is of great significance to detect the defects of the produced solar cells. [0003] There are many existing detection methods for solar cell defects, among which, the detection method based on machine vision has become the mainstream of current research because of its high efficiency and convenience. As an important link in the defect detection process, feature extraction...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06K9/46G06K9/40G01N21/88
CPCG01N21/8851G01N2021/8887G06V10/30G06V10/454G06F18/253G06F18/214
Inventor 钱晓亮栗靖田二林曾黎王慰王延峰杨存祥过金超史坤峰毋媛媛王芳
Owner ZHENGZHOU UNIVERSITY OF LIGHT INDUSTRY
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