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Refractory brick depth defect identification method based on height histogram segmentation

A technology with a high degree of histogram and identification method, applied in the field of deep defect identification of refractory bricks, to avoid the phenomenon of penetration corrosion, prolong the service life, and achieve the effect of high speed

Active Publication Date: 2019-09-10
SHANDONG IND TECH RES INST OF ZHEJIANG UNIV
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  • Application Information

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Problems solved by technology

At present, there is no measurement system or method for automatic measurement of surface defects of refractory bricks

Method used

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  • Refractory brick depth defect identification method based on height histogram segmentation
  • Refractory brick depth defect identification method based on height histogram segmentation
  • Refractory brick depth defect identification method based on height histogram segmentation

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Embodiment Construction

[0042] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0043] During the production process of refractory bricks, in addition to the surface scratches caused by contact, some deep defects will also be caused by the loss of the mold: pits, pockmarks, missing corners and edges. The image data collected by the Gocator2350 sensor is color point cloud data that is fused together with image data and 3D point cloud. In this regard, depth defects can be analyzed from the height information in the point cloud data.

[0044] The data collected by the sensor is color point cloud data, and its coordinate system is based on the sensor pose. Therefore, it is first necessary to fit the measured upper surface of the refractory brick, and perform height segmentation along its normal direction to obtain depth defect information.

[0045] A method for identifying depth defects in refractory bricks based on height hi...

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Abstract

The invention discloses a refractory brick depth defect identification method based on height histogram segmentation. The method comprises the following steps: acquiring color point cloud data of refractory bricks by utilizing a structured light sensor, wherein the color point cloud data is formed by fusing image data and three-dimensional point cloud; carrying out plane fitting on the point cloudof the refractory brick image by using a least square method to obtain a zero plane; obtaining the height and width of the original refractory brick image; and according to the size parameters and the zero plane of the original refractory brick image, generating a corresponding reference plane image, subtracting the original refractory brick image from the reference plane image to obtain a pointcloud data graph after tilt correction, and carrying out filtering segmentation on a height histogram of the point cloud after tilt correction to obtain point cloud information with a set depth. The method can analyze the image height map on the basis of gray moment plane fitting to obtain the depth defect information of the refractory bricks, effectively avoids the permeation corrosion phenomenon, and prolongs the service life of the refractory bricks.

Description

technical field [0001] The invention relates to a method for identifying depth defects of refractory bricks based on height histogram segmentation. Background technique [0002] Refractory bricks, according to international standards, refer to non-metallic materials and products that have stable chemical and physical properties and can be used normally in high temperature environments (not excluding a certain proportion of metals). Refractory bricks can withstand various mechanical actions and physical and chemical changes at high temperatures, and are widely used in metallurgy, chemical industry, petroleum, power generation and other industrial fields. In recent years, my country's refractory brick production enterprises have developed rapidly, and the market competition for refractory bricks has become increasingly fierce. Many enterprises have improved production technology and quality inspection technology, and realized production and testing automation to improve their ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G06T7/11G06T7/187
CPCG06T7/0008G06T7/11G06T7/187G06T2207/20028G06T2207/30132G06T5/70
Inventor 曹衍龙张远松杨将新王敬孙安顺董献瑞
Owner SHANDONG IND TECH RES INST OF ZHEJIANG UNIV
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