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DC circuit breaker semiconductor component turn-off capability test loop with protective function

A DC circuit breaker and capacity testing technology, which is applied in the direction of single semiconductor device testing, circuit breaker testing, diode testing, etc., can solve the problems of no testing method and circuit, etc., and achieve the effect of preventing insulation breakdown and protecting the unit simply

Active Publication Date: 2019-09-27
NORTH CHINA ELECTRIC POWER UNIV (BAODING) +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Carrying out the shut-off test of semiconductor components is the basis of the overall test of the hybrid DC circuit breaker, and it is also a necessary link to evaluate its shut-off capability and performance. At present, there is no relevant standard test method and circuit

Method used

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  • DC circuit breaker semiconductor component turn-off capability test loop with protective function
  • DC circuit breaker semiconductor component turn-off capability test loop with protective function
  • DC circuit breaker semiconductor component turn-off capability test loop with protective function

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Embodiment Construction

[0018] The invention provides a circuit for testing the shut-off capability of a semiconductor component of a DC circuit breaker with a protection function. The invention will be described below in conjunction with the accompanying drawings and embodiments.

[0019] Such as figure 1 The composition diagram of the test circuit for the shut-off capability of the semiconductor component of the high-voltage DC circuit breaker with the protection function is shown. The test circuit includes: a pre-charging unit 1, a test current generation unit 2, a thyristor trigger unit 3, a protection unit 4, and a semiconductor component under test 5 and the energy absorbing unit 6; figure 2 shown as figure 1 The specific test circuit schematic diagram. In the figure, the pre-charging unit 1 is composed of a DC power supply in series with the first mechanical switch S1; the test current generating unit 2 is composed of a capacitor C1 connected in parallel with the second mechanical switch S2...

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PUM

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Abstract

The invention discloses a DC circuit breaker semiconductor component turn-off capability test loop with a protective function, and belongs to the scope of a DC circuit breaker performance test device. The DC circuit breaker semiconductor component turn-off capability test loop comprises a pre-charging unit, a test current generating unit, a thyristor triggering unit, a protection unit, a tested semiconductor component and an energy absorbing unit. The pre-charging unit and the test current generating unit and an inductor L1 are connected to form an LC oscillation loop so as to generate the test current. According to the protection unit, only one diode is connected on the two ends of the main loop thyristor in an anti-parallel way. The voltage overshoot of the reactor due to the reverse recovery process of the thyristor can be limited. The energy absorbing unit is a sliding resistor which is connected in parallel on the ends of the tested semiconductor component. The loop has the characteristics of testing the current turn-off capability of multiple semiconductor components and can prevent the insulation breakdown of the reactor due to voltage overshoot so as to effectively protect the test reactor.

Description

technical field [0001] The invention belongs to the scope of a DC circuit breaker performance testing device, in particular to a circuit for testing the shut-off capability of a semiconductor component of a DC circuit breaker with a protective function. Background technique [0002] The hybrid DC circuit breaker is one of the important protection means for the safe and reliable operation of the DC system, and the semiconductor component is the basic core unit of the hybrid DC circuit breaker to break the fault current. Carrying out the shut-off test of semiconductor components is the basis of the overall test of the hybrid DC circuit breaker, and it is also a necessary link to evaluate its shut-off capability and performance. Currently, there is no relevant standard test method and circuit. Aiming at the current hybrid DC circuit breaker semiconductor component shutdown capability test circuit, the present invention proposes a DC circuit breaker semiconductor component shutd...

Claims

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Application Information

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IPC IPC(8): G01R31/327G01R31/26
CPCG01R31/2617G01R31/2633G01R31/327
Inventor 齐磊东野忠昊刘珂鑫张午宇魏晓光王成昊
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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