Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Spectral radiation luminance responsivity measurement system

A technology of spectral radiance and responsivity, applied in optical radiometry, radiation pyrometry, measuring devices, etc., can solve problems such as low accuracy and inability to accurately calibrate vacuum ultraviolet spectroradiometers

Inactive Publication Date: 2019-11-19
BEIJING ZHENXING METROLOGY & TEST INST
View PDF3 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The spectral radiance responsivity of the vacuum ultraviolet spectroradiometer can be used for the calibration test of the radiometer. However, the existing responsivity measurement methods in the prior art usually have the problem of low accuracy, and correspondingly, they cannot be accurately realized. Calibration of Vacuum Ultraviolet Spectroradiometer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spectral radiation luminance responsivity measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. In the following description, for purposes of explanation and not limitation, specific details are set forth in order to assist in a comprehensive understanding of the present invention. However, it will be apparent to those skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details.

[0027] It should be noted here that, in order to avoid obscuring the present invention due to unnecessary details, the accompanying drawings only show the device structure and / or processing steps closely related to the solution according to the present invention, and omit the details related to the present invention. Invent other details that are less relevant.

[0028] figure 1 This is a schematic structural diagram of a spectral radiation luminance responsivity measurement system provided by an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of optical testing equipment and discloses a spectral radiation luminance responsivity measurement system. The system comprises a vacuum ultraviolet lightsource, a vacuum ultraviolet monochrome beam splitter, a vacuum ultraviolet uniformizing device, a reference radiation luminance meter, a switching device, a controller and an oil-free vacuum chamber,wherein the vacuum ultraviolet light source is used for emitting vacuum ultraviolet light radiation; the vacuum ultraviolet monochrome beam splitter is used for carrying out beam-splitting processingon incident vacuum ultraviolet light radiation and then outputting light radiation with a predetermined wavelength; the vacuum ultraviolet uniformizing device is used for carrying out uniform processing on the output light radiation with the predetermined wavelength; the switching device is used for carrying out switching between alignment of the reference radiation luminance meter with the vacuum ultraviolet uniformizing device and alignment of a to-be-calibrated radiometer with the vacuum ultraviolet uniformizing device; the controller is used for calculating spectral radiation luminance responsivity of the to-be-calibrated radiometer according to radiation luminance values measured by the reference radiation luminance meter and the to-be-calibrated radiometer separately; and the oil-free vacuum chamber provides a vacuum environment, thereby accurately obtaining the spectral radiation luminance responsivity of the to-be-calibrated radiometer.

Description

technical field [0001] The invention relates to the technical field of optical testing equipment, in particular to a spectral radiation luminance responsivity measurement system. Background technique [0002] The working spectrum of the vacuum ultraviolet spectroradiometer is an important characteristic spectrum of space material composition, and it can give the vacuum ultraviolet spectrum information of the detection target at the same time. Today, the unprecedented development of research has become the focus of attention from countries all over the world. It has been repeatedly launched into space to observe the earth, the solar system and even the entire universe. Show the content and changing laws of various substances, thereby providing a large amount of research materials and reliable data for many frontier scientific researches such as the sun-terrestrial space environment, space weather, and the origin of the universe. [0003] Calibration test is an indispensable ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00G01J5/80
Inventor 孙广尉孙红胜王加朋张玉国杨旺林宋春晖吴红霞
Owner BEIJING ZHENXING METROLOGY & TEST INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products