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A Novel Structure of Two-step Single-slope Analog-to-Digital Converter

A new type of structure and digital converter technology, applied in the direction of analog-to-digital converter, analog/digital conversion, analog/digital conversion calibration/testing, etc., can solve the problems of deterioration of the overall index of ADC, high gain, high power consumption of comparator, etc.

Active Publication Date: 2022-05-03
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] For the above-mentioned two-step single-slope ADC, it can be seen that for different input signals, the comparator is compared near different common-mode levels, and due to the limited common-mode rejection ratio of the comparator, the The input offset of the comparator is related to the input common-mode level; in the multi-stage comparator 101, the input offset storage is used, which requires the comparator to obtain higher gain through larger power consumption, and the above disadvantages will Deteriorating overall metrics for ADCs

Method used

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  • A Novel Structure of Two-step Single-slope Analog-to-Digital Converter
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  • A Novel Structure of Two-step Single-slope Analog-to-Digital Converter

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Embodiment Construction

[0024] In conjunction with the accompanying drawings, the present invention will be further described through embodiments.

[0025] as attached figure 2 Shown is a two-step single-slope analog-to-digital converter with a novel structure of the present invention, including a comparator 201 , a digital logic control circuit 202 , a switched capacitor control circuit 203 , and a ramp generator 204 .

[0026] V IN is the overall input signal, connected to the switch S in the switched capacitor control circuit 203 1 ; switch S 1 the other end of the switch S 2 one end of the capacitor C H one end and the capacitor C C One end is connected to point P2. Capacitor C C the other end of the switch S 3 One end is connected to the P1 point, and the P1 point is connected to the positive terminal of the comparator 201, as the positive terminal input of the comparator 201, the switch S 3 The other end is connected to a fixed voltage V T superior. Capacitor C H the other end of t...

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Abstract

The invention belongs to the technical field of analog-to-digital conversion, in particular to a two-step single-slope analog-to-digital converter with a novel structure. In the present invention, by setting the negative terminal input of the comparator 201 as a fixed level V T , the positive terminal input passes through the function of the switched capacitor control circuit 203, so that the positive terminal input includes the input signal V IN , fixed level V T and ramp voltage (coarse ramp voltage V Ramp_Coarse and fine ramp voltage V Ramp_Fine ), so that in each quantization, the comparator 201 is at a fixed level V T Comparing nearby reduces the impact of the comparator input offset voltage and achieves better performance indicators.

Description

technical field [0001] The invention belongs to the technical field of analog-to-digital conversion, in particular to a two-step monoslope analog-to-digital converter with a novel structure. Background technique [0002] An analog-to-digital converter (Analog to Digital Converter, ADC) converts a natural continuous-time, continuous-amplitude analog signal into a discrete-time, discrete-amplitude digital signal, and supplies the subsystem for processing. Various performance indicators of ADC, including resolution, sampling rate, and power consumption, directly affect the processing capability of the entire system. As one of the core modules of electronic system, ADC is a hotspot of electronic system research and design. However, due to the influence of non-ideal factors such as device mismatch, parasitics, coupling, and noise in the actual circuit, as well as the limited circuit area, the actual ADC test results cannot achieve the pre-simulated performance. Therefore, caref...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/10H03M1/06H03M1/00H03M1/12
CPCH03M1/1014H03M1/0617H03M1/002H03M1/124
Inventor 李靖邓恒张启辉廖勇王子怡
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA