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Detection device for multi-angle nanometer granularity measurement and detection method thereof

A detection device and nanoparticle technology, applied in the direction of measurement devices, nanoparticle analysis, particle size analysis, etc., can solve problems such as excessive detection errors, achieve the effect of improving accuracy and reducing the impact of detection results

Inactive Publication Date: 2020-01-10
南京牧科纳米科技有限公司
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Problems solved by technology

[0004] In the prior art, the laser beam of the dynamic light dispersion nanometer particle size analyzer can only irradiate the particle sample solution from a fixed angle. This detection method has certain randomness and contingency, and it is very easy to detect the situation where the error is too large for the sample solution with uneven particle distribution.

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[0036] In the following description, numerous specific details are given in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without one or more of these details. In other examples, some technical features known in the art are not described in order to avoid confusion with the present invention.

[0037]Researchers have found that the particle size of nanomaterials needs to be detected during the preparation of nanomaterials. The existing detection methods mainly include electrical induction method, sedimentation method, microscope method and light scattering method, among which light scattering method is widely used. The scattering method is mainly divided into the static light scattering method and the dynamic light scattering method. The detection equipment used in the dynamic light scattering method is a dynamic light scattering nanometer particle siz...

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Abstract

The invention discloses a detection device for multi-angle nanometer granularity measurement and a detection method thereof, and belongs to the field of nanometer granularity detection. The detectiondevice for multi-angle nanometer granularity measurement comprises a laser emitter, a lens, a sample cell, a detector, a calculator and a rotating mechanism, wherein the rotating mechanism comprises arotating part and a static part, the angle at which the laser emitter irradiates the sample cell changes along with the relative rotation of the rotating part and the static part, and the angle of scattered light detected by the detector also changes, namely the detector can detect the scattered light intensity at different scattering angles. Compared with the prior art, according to the detection device for multi-angle nanometer granularity measurement provided by the invention, the light intensity change under different scattering angles is detected by changing the angle of the laser irradiation sample pool, so that the detection of nanometer granularity is realized, the influence on the detection result due to different irradiation angles and different scattering angles is reduced, andthe detection accuracy of nanometer granularity is improved.

Description

technical field [0001] The invention belongs to the field of nanometer particle size detection, in particular to a detection device and a detection method for multi-angle measurement of nanometer particle size. Background technique [0002] With the continuous development of science and technology, the preparation and application of nanomaterials are closely related to people's lives. In the preparation process of nanomaterials, nanoparticle size is the most basic testing item. Nanoparticle size refers to the size of nanoparticles. Nanoparticles are generally Refers to particles with a particle size of less than 100nm. In order to meet the requirements of production and preparation for the particle size of nanoparticles, it is necessary to detect the particle size of nanoparticles. The existing detection methods mainly include electric induction method, sedimentation method, microscope method and light scattering method, among which light scattering method is used as many na...

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Application Information

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IPC IPC(8): G01N15/02
CPCG01N15/0211G01N2015/0038G01N2015/0222
Inventor 曾海波蒋连福
Owner 南京牧科纳米科技有限公司
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