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An infrared detector focal plane temperature measuring device

An infrared detector, temperature measurement technology, applied in measurement devices, optical radiation measurement, instruments, etc., can solve the problems of insufficient temperature measurement accuracy and resolution, improve measurement accuracy and resolution, reduce quantization noise and random noise , the effect of improving precision and accuracy

Active Publication Date: 2021-07-16
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, the infrared detector focal plane temperature measurement device in the prior art also has certain defects, the main defect of which is: its temperature measurement accuracy and resolution are insufficient

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  • An infrared detector focal plane temperature measuring device
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Embodiment Construction

[0024] The above and other technical features and advantages of the present invention will be described in more detail below in conjunction with the accompanying drawings.

[0025] In the description of the present invention, it should be understood that the terms "first" and "second" are used for description purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features. In the description of the present invention, "plurality" means at least two, unless otherwise specifically defined.

[0026] In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; can b...

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Abstract

The invention provides an infrared detector focal plane temperature measuring device, which includes a constant current source circuit, a temperature measuring diode and a subtraction circuit, the constant current source circuit is used to supply constant current for the temperature measuring diode; the subtraction circuit includes a first input terminal, The second input terminal and the output terminal, the first input terminal of the subtraction circuit is connected to the anode of the temperature-measuring diode, the second input terminal of the subtraction circuit is connected to the reference level, and the subtraction circuit is used to combine the reference level with the voltage of the temperature-measuring diode After the difference is reduced, the multiplied output is amplified, and the output terminal of the subtraction circuit is connected to an analog-to-digital converter. Compared with the prior art, the beneficial effect of the present invention is that: the device improves the measurement accuracy of measuring the diode voltage drop through the constant current source circuit and the subtraction circuit, thereby improving the precision and accuracy of temperature measurement. In addition, the device uses an analog-to-digital converter to sample and quantize the amplified voltage value, which can effectively reduce the impact of quantization noise and random noise, and improve the measurement accuracy and resolution of the temperature-measuring diode voltage drop.

Description

technical field [0001] The invention relates to the technical field of temperature measuring equipment, in particular to an infrared detector focal plane temperature measuring device. Background technique [0002] When the supply current remains constant, there is a good linear relationship between the forward voltage of the P-N junction and the temperature. Taking advantage of this characteristic, diodes are used for temperature measurement. For example, the temperature measurement of the focal plane of the infrared detector usually adopts the method of diode temperature measurement. [0003] The background noise of the infrared detector is very sensitive to temperature, and a change of a few tenths of a degree in the focal surface temperature will obviously change the background noise, thereby affecting the output result of the detector. This is why almost all infrared detectors, including short-wave infrared detectors, medium-wave infrared detectors, and long-wave infra...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/06
CPCG01J5/00G01J5/06
Inventor 张航郑玉权李帅刘栋斌
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI