A non-linear column-level ADC and method for improving the contrast of cmos image sensors

Abstract

The invention discloses a nonlinear column-level ADC for improving the contrast of a CMOS image sensor, which includes a nonlinear ramp generator connected to a counter as the same clock input, the output end of the ramp generator connected to the positive input end of a comparator, and the negative input end of the comparator The terminal is connected to the pixel voltage sampling, the output terminal of the comparator is connected to the latch and the register in turn, and the register is also connected to the counter, and the register is used to save the value of the counter and output the result. The invention also discloses a method for improving the contrast of the CMOS image sensor The method not only improves the contrast of the CMOS image sensor, but also can effectively identify the cell image under the lensless imaging system.

Description

technical field [0001] The invention belongs to the technical field of high-contrast CMOS image sensors, and in particular relates to a nonlinear column-level ADC for improving the contrast of CMOS image sensors. [0002] The invention also relates to a method for improving the contrast of the CMOS image sensor. Background technique [0003] With the development of the field of biomedical diagnostic testing, cell detection technology provides an important basis for diagnosing the life status and basic information of organisms. Different physical conditions will correspond to different cell types, cell numbers, cell structures, and cell shapes. Understanding the various characteristics of these cells is of great significance for human health, disease research, and drug development. The most basic cell detection methods at this stage include chemical detection and optical microscope detection, but their operations are complicated and require professionals to operate, which ca...

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