Low-temperature XRD testing device, testing equipment and testing system

Abstract

The invention relates to the technical field of low-temperature XRD testing, in particular to a low-temperature XRD testing device, testing equipment and a testing system. The low-temperature XRD testing device comprises an inner sealing cavity, an outer sealing cavity, an inner sealing cavity and an outer sealing cavity, the outer side of the inner sealing cavity is coated with the outer sealingcavity; a vacuum interlayer is formed between the outer sealing cavity and the inner sealing cavity; an air inlet channel and an air outlet channel which are respectively communicated with the air inlet and the air outlet and penetrate through the outer sealing cavity; and a heat insulation connecting structure which is arranged in the inner sealing cavity and connected with the inner wall of theinner sealing cavity, and the heat insulation connecting structure comprises a sample table and a mounting part used for mounting the temperature measuring device. According to the device, the measured surface temperature of a sample can be accurate, the accuracy of an experiment result is improved, meanwhile, the selection flexibility of the sample table can be improved, and interference on sample spectral peak analysis can be avoided by selecting the sample table made of an amorphous material.

Description

technical field [0001] The invention relates to the technical field of low-temperature XRD testing, in particular to a low-temperature XRD testing device, testing equipment, and testing system. Background technique [0002] XRD is the abbreviation of X-ray diffraction (X-ray diffraction). X-ray diffraction is a method to accurately determine the crystal structure, texture and stress of materials by using the principle of diffraction. It has an irreplaceable role in material analysis. role. Today, X-ray diffractometers are not only used in basic subjects such as chemistry, physics, materials, geology, and biology, but also widely used in industrial fields such as energy, environmental protection, public security and justice, textiles, minerals, ceramics, medicine, and food. detection means to be applied. [0003] With the continuous improvement of scientific research needs, the requirements for analytical instruments are also increasing. The diffractometer of the test unit...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the in-situ low-temperature XRD technology in the prior art that uses heat conduction to reduce the sample temperature, which easily leads to inaccurate measured sample surface temperatures, which in turn leads to deviations in experimental results, and the need to select samples with good thermal conductivity platform, resulting in the technical problem that the X-ray diffraction peak of the sample platform may interfere with the analysis of the sample spectral peak, thereby providing a low-temperature XRD test device, test equipment and test system, the device, equipment and system can make the measured sample surface temperature It is more accurate, improves the accuracy of the experimental results, and at the same time can improve the flexibility of sample stage selection, and can avoid interference to the sample spectrum peak analysis by selecting an amorphous material sample stage

Images