Ultrahigh-speed successive approximation type analog-to-digital converter

Abstract

The invention discloses an ultrahigh-speed successive approximation type analog-to-digital converter, which comprises a sampling switch module, a capacitor DAC module, a comparator module, an asynchronous clock generation module and an SAR logic control module, and is characterized in that the sampling switch module is used for sampling a first input signal and a second input signal and transmitting the first input signal and the second input signal to the capacitor DAC module; the capacitor DAC module is used for storing, maintaining and redistributing the first input signal and the second input signal; the comparator module is used for comparing the signals redistributed by the capacitor DAC module to obtain a comparison result; the asynchronous clock generation module is used for controlling the comparator module to work and reset according to the comparison result; and the SAR logic control module is used for controlling the capacitor DAC module to generate a reference level required by the comparator module according to the comparison result and outputting a final analog-to-digital conversion signal. According to the analog-to-digital converter, the overall speed of the comparator is increased, the quantization correctness is ensured, the quantization rate is increased, and the chip area is reduced.

Description

technical field [0001] The invention belongs to the technical field of digital-analog hybrid integrated circuit design, and in particular relates to an ultra-high-speed successive approximation analog-to-digital converter. Background technique [0002] With the rapid development of communication systems and the wide application of embedded systems, more and more attention has been paid to the research on the analog-to-digital converter (ADC) and digital-to-analog converter (DCA) of the interface circuits of the analog and digital parts. Various application systems require ADC to have high sampling rate, high precision and wide dynamic range. With the continuous reduction of the feature size of CMOS devices, the impact of the secondary effect of the device becomes more and more significant, the power supply voltage continues to decrease, and the design of analog units such as operational amplifiers becomes larger and larger. SAR ADC has been widely used in the industry becau...

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Problems solved by technology

However, the sampling rate and sampling accuracy of the existing SARADC are low, and the

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