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Method for in-situ identification of nano plastic particles on solid surface based on scanning electron microscope-Raman technology

A nanoplastic and solid surface technology, applied in Raman scattering, material analysis, material excitation analysis, etc., can solve the problem of identification of unused organic nanomaterials, high electron beam and beam intensity, and in-situ identification of single nanoplastic particles etc. to achieve the effects of reducing background interference, simple equipment operation, and easy observation

Inactive Publication Date: 2020-05-08
TONGJI UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, ordinary infrared spectroscopy and Raman spectroscopy are usually measured by ex-situ pressing the sample or placing it on the filter membrane, which cannot realize the in-situ identification of individual nanoplastic particles
Due to its high electron beam and beam intensity, the new electron microscope-spectroscopy technology is mainly used for the analysis and identification of minerals, inorganic nano materials and other materials, but not for the identification of organic nano materials.

Method used

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  • Method for in-situ identification of nano plastic particles on solid surface based on scanning electron microscope-Raman technology
  • Method for in-situ identification of nano plastic particles on solid surface based on scanning electron microscope-Raman technology
  • Method for in-situ identification of nano plastic particles on solid surface based on scanning electron microscope-Raman technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] Example 1 In-situ Identification of Nanoparticles on the Surface of Regenerated Pipe Powder

[0017] The sample is recycled pipe powder with a particle size of 232 μm. First, paste the conductive adhesive on the copper or aluminum sample base, stick the recycled pipe powder directly to the conductive adhesive, blow off the unglued powder on the conductive adhesive with the ear-absorbing ball, and then put it into the electron microscope for direct observation. It was observed that there were a large number of nanoparticles with a size of 300-700 nm on the surface of the micron powder sample ( figure 1 A), confirm the particles that need to be analyzed by Raman under the electron microscope, quickly switch to the Raman mode, and carry out particle identification according to the set test parameters.

[0018] Such as figure 1 As shown in B, yes figure 1 Single-point assays for different nanoparticles (P1 and P2) in A. It was found that both P1 and P2 had obvious C-C...

Embodiment 2

[0019] Example 2 In-situ Identification of Nanoparticles on the Surface of Window Frame Recycled Plastics

[0020] The sample is recycled plastic powder for window frames. First, paste the conductive adhesive on the copper or aluminum sample base, stick the recycled pipe powder directly to the conductive adhesive, and use the suction ear ball to blow off the unglued powder on the conductive adhesive. It can be observed that there are a large number of micron-sized powder samples. Nanoparticles; Confirm the particles that need to be analyzed by Raman under the electron microscope, quickly switch to Raman mode, and carry out particle identification according to the set test parameters.

[0021] right figure 2 In A, P1 and P2 (P1 and P2 are different nanoparticles selected on the solid surface of the window frame recycled plastic powder) are measured at a single point. figure 2 B shows that P1 has a Raman characteristic peak (639cm -1 , 697cm -1 , 1088cm -1 , 1126cm -1 ...

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Abstract

The invention belongs to the field of nano plastic identification. The invention discloses a method for in-situ identification of nano plastic particles on a solid surface based on a scanning electronmicroscope-Raman technology. On the premise of ensuring that an organic structure of the nano plastic is not damaged, parameter setting and testing are carried out through a scanning electron microscope and a white-light-containing confocal microscopic Raman spectrometer, and the method comprises the following steps: identifying existing nano particles of a to-be-detected solid sample in a targeted manner by adopting a scanning electron microscope under the condition of low-voltage electron beams on the surface of the to-be-detected solid sample; and performing in-situ identification of whether the identified nanoparticles are nano-plastics by confocal microRaman spectroscopy, the minimum identification size being 360 nm, and real-time identification of whether the nanoparticles contain plastic components. According to the method, in-situ identification of chemical components of single nanoscale particles can be achieved, and meanwhile it is ensured that the plastic structures of thenanoparticles are not damaged by electron beams.

Description

technical field [0001] The invention belongs to the technical field of nanoplastic identification, and relates to an in-situ identification method for solid surface nanoplastics, in particular to a method for realizing in-situ identification of solid surface nanoplastic particles by determining parameters based on scanning electron microscope-Raman technology. Background technique [0002] Solid plastics exposed to the natural environment for a long time will undergo weathering and aging, cracks or particle protrusions will appear on the surface, and the edges and corners will become rounded, which may generate nano-scale plastic particles on the surface. The existing conventional detection technology is still unable to realize the in-situ identification of the nanoscale material components of single particles on the solid surface. The main reasons are: (1) the nanoparticles are small and difficult to locate accurately; It is impossible to achieve nanoscale in-situ analysis ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2251G01N21/65
CPCG01N21/65G01N23/2251
Inventor 邱宇平张文董志强侯元璋
Owner TONGJI UNIV
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