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A Quick Test Method of Digital Circuit Based on Tcl Language

A technology of digital circuits and testing methods, applied in the field of digital circuits, can solve the problems of high time cost, repeated code development, poor versatility, etc., and achieves the effect of reducing workload, avoiding repeated development, and improving versatility

Active Publication Date: 2022-03-01
NO 20 RES INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The purpose of the present invention is to solve the problems of repeated code development, poor versatility, and high time cost in the prior art, by using the developed TCL code to control the peripheral circuit

Method used

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  • A Quick Test Method of Digital Circuit Based on Tcl Language

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Embodiment Construction

[0028] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0029] Taking the XILINX company model xc7a35t FPGA control TR component and AD9643 as examples, the technical solution of the present invention is further described from three aspects of configuration parameters, data writing and data reading.

[0030] Step 1: Configure parameters

[0031] It mainly includes configuring vio, configuring RAM and configuring peripheral circuits.

[0032] Configuring vio: In this embodiment, configuring vio is mainly to configure TR components. The following uses configuring the TR component as an example to illustrate the configuration steps.

[0033] 1) Use proc to declare the function wr_trctl, and the data format is addr data1 data2 data3 data4 data5, where addr represents the address of each channel in the TR component, data1 represents the sending and receiving status of each channel, data2, data3, data4, and data...

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Abstract

The present invention provides a digital circuit rapid testing method based on the TCL language. By using the developed TCL code to control the peripheral circuit, the TCL command library under the vivado environment is used to realize the integration, calling and nesting of functions, and the digital circuit needs to be repeatedly tested. Different from peripheral devices, it has high test rate and good versatility. The present invention avoids manually modifying the state and parameters each time, improves the test efficiency, and avoids modifying the FPGA program at the same time, saves the test time and reduces the workload; it is convenient to check the state of the vio at any time during debugging and program verification, and at the same time avoids It eliminates the need to rewrite all the programs when modifying the program, and only needs to rewrite the modified part; the original program function can be realized only by rewriting the addresses of peripheral devices, and the batch processing of digital circuit tests can be realized, which avoids the need for different test environments. The repeated development of the test program has good versatility.

Description

technical field [0001] The invention relates to the field of digital circuits, in particular to a fast testing method for digital circuits. Background technique [0002] Digital circuits are widely used in aviation, aerospace, navigation, communications, computer hardware systems, program control, digital system testing and diagnosis, etc. With the increasing scale and wide application of digital circuit design, its importance and complexity are also increasing, so the demand for testing digital circuits has become particularly urgent. [0003] In digital circuit testing, peripheral devices often need to be initialized and configured. In the existing digital circuit testing methods, each configuration needs to manually input the address, data and status one by one, change the pin status and read and write data, and then perform Compile; when changing the peripheral device, the program needs to be developed and compiled again. [0004] There is an obvious problem in the abo...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/319G01R31/3183
CPCG01R31/31919G01R31/318371G01R31/318314
Inventor 肖驰关炀
Owner NO 20 RES INST OF CHINA ELECTRONICS TECH GRP