Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System and method for test planning based on hypercube topology in network-on-chip

A topology and hypercube technology, applied in transmission systems, digital transmission systems, data exchange networks, etc., can solve problems such as low test efficiency and long time spent, and achieve low test efficiency, reduced test time, and improved test performance. efficiency effect

Active Publication Date: 2021-10-22
GUILIN UNIV OF ELECTRONIC TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a test planning system and method based on a hypercube topology in an on-chip network, aiming to solve the problem of low test efficiency caused by the long time spent in the process of testing the on-chip network using traditional structural algorithms

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method for test planning based on hypercube topology in network-on-chip
  • System and method for test planning based on hypercube topology in network-on-chip
  • System and method for test planning based on hypercube topology in network-on-chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary, and are intended to explain the present invention and should not be construed as limiting the present invention.

[0041] In the description of the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientations or positional relationships indicated by "horizontal", "top", "bottom", "inside", "outside", etc. are based on the orientations or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the present invention and simplifying the description, rather...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test planning system and method based on a hypercube topology in an on-chip network, including an IP core extraction module, an IP core encoding module, an input port allocation module, a path algorithm module, and an output port allocation module And the data analysis module, the IP core extraction module extracts the test IP core in the circuit to be tested and the parameters required for testing, and encodes and maps the IP core with a hypercube structure through the IP core encoding module, and the test vector is allocated by the input port The module is assigned to the designated port, and then the path algorithm module uses the E-cube algorithm with partial self-adaptive ability to plan the path, tests the IP core, and the test results are planned and sent to the output by the E-cube algorithm with partial self-adaptive ability Port assignment mod. By reducing the number of routers passing through the test process, the distance between IP cores and the diversity of routing node selection in the data transmission process, the test time of IP cores is reduced and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a test planning system and method based on a hypercube topology in an on-chip network. Background technique [0002] The specific test process of the on-chip network is as follows: first, the test vector enters the topology structure from the input port, and is transmitted to the IP core to be tested by a certain routing strategy and waits for the test to be completed, and then the test response of the IP core is passed through the topology structure again with a certain routing algorithm. transmitted to the output port for analysis. [0003] The topology structure reflects the connection and layout of communication nodes, which will affect the communication delay and network throughput of the on-chip network; the routing algorithm determines the transmission path of the message in the network, and a good routing algorithm can improve the performance of the interconnecte...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26H04L12/721H04L12/751H04L45/02
CPCH04L43/50H04L45/02H04L45/14
Inventor 胡聪信文雪周甜朱爱军许川佩梁志勋黄喜军
Owner GUILIN UNIV OF ELECTRONIC TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products