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Connector structure and calculation method and device of delay inequality

A connector and time-delay technology, applied in the field of communication, can solve the problems affecting the accuracy of the connector and the time-delay difference, and achieve the effect of eliminating influence, high precision and improving performance.

Pending Publication Date: 2020-07-03
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present invention provides a connector structure, a method and a device for calculating the delay difference, so as to at least solve the large error introduced in the calculation of the skew of the connector caused by the inability to remove the skew of the PCB trace in the related art, which affects The real skew performance evaluation of the connector and the accuracy of the system evaluation

Method used

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  • Connector structure and calculation method and device of delay inequality
  • Connector structure and calculation method and device of delay inequality
  • Connector structure and calculation method and device of delay inequality

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0037] In this embodiment, a connector structure is also provided, figure 1 is a structural schematic diagram of a connector structure according to an embodiment of the present invention, such as figure 1 As shown, the connector structure includes: a first PCB 12 and a second PCB 14 .

[0038] The first PCB 12, including the first plate 122 and the second plate 124, is connected with the testing device;

[0039] The second PCB 14 , including a third board 142 and a fourth board 144 , is connected to the test device; wherein, the first board 122 is connected to the third board 142 through a connector 16 .

[0040] figure 2 is a structural schematic diagram of another connector structure according to an embodiment of the present invention, such as figure 2As shown, each board includes at least: a hole array 22, a trace 24, and a test point 26; 16 positions overlap; the wiring 24 is located inside each of the boards, and one end is used to connect to the differential pin 18...

Embodiment 2

[0077] In this embodiment, a calculation method of a delay difference applied in the test device connected to the connector structure in Embodiment 1 is provided. Figure 9 is a flow chart of calculating a delay difference according to an embodiment of the present invention, such as Figure 9 As shown, the process includes the following steps:

[0078] Step S902, measuring a first delay difference skew1 between the first board, the connector and the third board;

[0079] Step S904, measuring the second delay difference skew2 of the second block and the third delay difference skew3 of the fourth block;

[0080] Step S906, according to the skew1, the skew2 and the skew3, calculate the difference parameter skew of the connector.

[0081] Optionally, the skew is calculated according to the skew1, the skew2 and the skew3, and is determined by the following formula: skew=skew1-skew2-skew3.

[0082] It should be noted that, when the above formula can realize the conditions, the fi...

Embodiment 3

[0099] An embodiment of the present invention also provides a storage medium, in which a computer program is stored, wherein the computer program is set to execute the steps in any one of the above method embodiments when running.

[0100] Optionally, in this embodiment, the above-mentioned storage medium may be configured to store a computer program for performing the following steps:

[0101] S1, measuring a first delay difference skew1 between the first board, the connector and the third board;

[0102] S2, measuring the second delay difference skew2 of the second block and the third delay difference skew3 of the fourth block;

[0103] S3. Calculate a differential parameter skew of the connector according to the skew1, the skew2 and the skew3.

[0104] Optionally, in this embodiment, the above-mentioned storage medium may include but not limited to: U disk, read-only memory (Read-Only Memory, ROM for short), random access memory (Random Access Memory, RAM for short), Vari...

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Abstract

The invention provides a connector structure and a time delay difference calculation method and device. Specifically, the connector structure comprises a first printed circuit board (PCB) which comprises a first plate block and a second plate block and is connected with a test device; the second PCB comprises a third plate and a fourth plate and is connected with the testing device; wherein the first plate block is connected with the third plate block through a connector. When skew calculation is carried out through the connector structure, the influence of PCB wiring skew parameters on calculation of the skew of the connector can be eliminated, meanwhile, the skew performance of the high-speed connector can be improved, and it is guaranteed that the skew of the tested connector has very high precision.

Description

technical field [0001] The present invention relates to the communication field, in particular to a connector structure, a calculation method and a device for delay difference. Background technique [0002] With the gradual increase of system capacity, high-speed Serdes has entered the era of 56Gbps / lane, and major chip manufacturers, system manufacturers, and standards organizations have all started research on 112Gbps. As the rate of a single channel increases, the requirements for the skew between the P / N differential signals become more and more stringent. In high-speed serial systems, high-speed connectors (conventional backplane connectors, orthogonal connectors, and cable connectors, etc.) device. Therefore, the skew in the differential pair of high-speed connectors also affects the performance of the entire system. It is a very important signal integrity parameter and requires accurate testing and evaluation. [0003] At present, for the evaluation of connector sk...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F13/40H01R12/71
CPCG06F11/221G06F13/4068H01R12/71G09B23/183H05K3/022H05K1/0268H05K2201/09781H05K1/115H05K3/366H05K3/368H05K1/144H05K2201/042H05K2201/10189G01R31/68G06F30/394G06F2115/12
Inventor 陈新剑任永会班荣兴王迎新
Owner ZTE CORP