FPGA internal DSP unit test equipment and use method

Abstract

The invention aims to provide FPGA internal DSP unit test equipment and a use method. The equipment is used for performing full-coverage test on functions and performance of a DSP unit in an FPGA chipand realizing low cost and miniaturization of the test system. The equipment is based on a PXI industrial personal computer platform. A 3U PXI programmable code pattern generator module is integratedin the industrial personal computer to serve as a clock source. The 3U PXI power supply module is used as a controllable power supply for a DSP test of a digital signal processing unit circuit in theFPGA. The 3U PXI oscilloscope module tests DSP alternating current and direct current simulation parameters. A self-developed low-cost FPGA DSP circuit tests a PCB hardware platform. In a PXI industrial personal computer, communication between a test module and a test PCB hardware platform is realized based on a PXI bus, DSP circuit test software is designed and integrated based on an LABVIEW software environment to realize full-function and full-performance test of a DSP, and low cost and miniaturization of the test are realized.

Description

technical field [0001] The invention belongs to the field of FPGA testing, and in particular relates to an FPGA internal DSP unit testing device and a using method. Background technique [0002] In order to adapt to more and more complex DSP operations, a powerful DSP unit is embedded in the FPGA chip. The DSP circuit of the FPGA is the key core circuit of the digital operation design of the FPGA chip. The internal digital signal processing circuit DSP of the FPGA can realize the A variety of mathematical operations in signal processing enable the DSP module of the FPGA to perform operations on digital signals according to user design. The DSP unit circuit includes basic input, output, operation, carry and other logic units, which can work at different rates. Resources can be combined into different logical functions. DSP testing must fully cover these functions and performance. [0003] Usually after the FPGA chip comes back, it is necessary to perform a full-coverage tes...

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Problems solved by technology

[0004] Usually batches of FPGA on-chip circuit tests are tested in ATE mode, such as: CFG, CLB, BRAM, IO and other module circuits. The test machine is expensive, and the above-mentioned tests are mostly functional tests. This test method is suitable for mature mass-produced FPGA chip tests.

[0005] It is inconvenient to use this method in the MPW stage of the FPGA, the initial sample design debugging and tracking stage, and the later sample performance sampling stage. It is inconvenient to debug and design. Use various special test instruments to test the function of the digital signal processing unit circuit DSP inside the FPGA chip. , The performance parameters can be tested in all aspects, but there are too many types of instruments used, the special test instruments have complete functions, and the performance indicators far exceed the test requirements, resulting in expensive prices, complicated connections of various test instruments, and high test costs.

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