Spectrum detection device and method for ferroelectric crystal structure

A technology for ferroelectric crystal and spectral detection, which is applied in measuring devices, fluorescence/phosphorescence, and material analysis through optical means, can solve the problem of inability to intuitively and dynamically detect microscopic domain structure changes and macroscopic phase structure changes of ferroelectric crystals, etc. problem, to achieve the effect of real-time dynamic detection

Inactive Publication Date: 2020-07-28
FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] According to one aspect of the present application, a spectroscopic detection device and method for a ferroelectric crystal structure is provided to overcome the problem in the related art that it is impossible to intuitively and dynamically detect changes in the microscopic domain structure and macroscopic phase structure of ferroelectric crystals

Method used

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  • Spectrum detection device and method for ferroelectric crystal structure
  • Spectrum detection device and method for ferroelectric crystal structure
  • Spectrum detection device and method for ferroelectric crystal structure

Examples

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Embodiment 1

[0084] figure 1 It is a schematic structural diagram of the spectroscopic detection device of the ferroelectric crystal structure provided in this embodiment.

[0085] Such as figure 1 As shown, the spectrum detection device of the ferroelectric crystal structure includes a light source 1, a temperature control part 2, a sample to be measured 3 located in the temperature control part 2, a power supply 4, a spectrum detection part 5 and an analysis detection part 6; wherein, the temperature control part 2 is a temperature-controlled sample chamber provided with two light holes (201 and 202), the light hole 201 is facing the light output side of the light source 1, the light hole 202 is facing the light incident side of the spectral detection part 5, and the analysis and detection part 6 is connected to the spectrum detection part 5, and the two electrodes of the power supply 4 are respectively connected to the sample 3 to be tested.

[0086] Combine below figure 1 The spectr...

Embodiment 2

[0089] The light source 1 in Example 1 is a xenon lamp, a monochromator is set on the light output side of the light source 1, the sample 3 to be tested is located on the light output side of the monochromator, the power supply is an adjustable DC power supply, and the temperature control unit 2 is a temperature control platform. The test sample 3 is placed on the temperature control part 2, the spectral detection part 5 is located on the light-emitting side of the test sample 3, and the test sample 3 adopts tetragonal phase Yb:PMN-PT (ytterbium doped [(1-x)Pb(Mg 1 / 3 Nb 2 / 3 )O 3 -xPbTiO 3 ) ferroelectric crystal. Below in conjunction with the device of this embodiment 2, the spectral detection method of the ferroelectric crystal structure is described:

[0090] Step 1. Use an X-ray diffractometer to carry out crystallographic orientation on the sample to be tested, and cut the crystal according to the orientation of [001] to obtain a sheet-shaped sample with a size of 5mm...

Embodiment 3

[0096] The sample 3 to be tested in Example 3 is a tetragonal Yb:PMN-PT ferroelectric crystal obtained by cutting the crystal according to the [110] orientation, and other steps are the same as in Example 2.

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Abstract

The invention discloses a spectrum detection device and method for a ferroelectric crystal structure, relates to the technical field of material detection, and aims to solve the problem that the change of a micro domain structure and the change of a macro phase structure of a ferroelectric crystal cannot be visually and dynamically detected in related technologies. The device comprises a temperature control part, a power supply, a light source and a spectrum detection part, wherein the positive and negative electrodes of the power supply are connected with a to-be-tested sample and are used for providing voltage for the to-be-tested sample; the to-be-tested sample is positioned on the light emitting side of the light source; the spectrum detection part is used for collecting a fluorescencespectrum signal excited by the to-be-tested sample under the irradiation effect of the laser beam emitted by the light source; and a temperature control part is used for controlling the temperature of the to-be-tested sample. According to the device and the method, the structure change information of the to-be-tested sample can be detected through the change of the fluorescence spectrum under thecondition that an external field (including temperature and voltage) changes, dynamic detection of the domain structure and the phase structure of the ferroelectric crystal is realized, and a new detection mode is provided for detection of the ferroelectric crystal structure.

Description

technical field [0001] The application relates to the technical field of material detection, and specifically discloses a ferroelectric crystal structure spectral detection device and a ferroelectric crystal structure spectral detection method. Background technique [0002] Ferroelectric crystals are an important class of functional materials with excellent dielectric, piezoelectric, electro-optic, and photorefractive properties. They are widely used in modern electronics industry and defense technologies, such as piezoelectric sensors, transducers, and electro-optic modulators. ,driver. The excellent macroscopic properties of ferroelectric crystals are closely related to their structures, including macroscopic phase structure and microscopic domain structure. Understanding the changes of the macroscopic phase structure and microscopic domain structure of ferroelectric crystals under external field is an important basis for understanding the properties of ferroelectric crys...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64
CPCG01N21/6402
Inventor 何超龙西法苏彬许兰
Owner FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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