Spectrum detection device and method for ferroelectric crystal structure
A technology for ferroelectric crystal and spectral detection, which is applied in measuring devices, fluorescence/phosphorescence, and material analysis through optical means, can solve the problem of inability to intuitively and dynamically detect microscopic domain structure changes and macroscopic phase structure changes of ferroelectric crystals, etc. problem, to achieve the effect of real-time dynamic detection
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0084] figure 1 It is a schematic structural diagram of the spectroscopic detection device of the ferroelectric crystal structure provided in this embodiment.
[0085] Such as figure 1 As shown, the spectrum detection device of the ferroelectric crystal structure includes a light source 1, a temperature control part 2, a sample to be measured 3 located in the temperature control part 2, a power supply 4, a spectrum detection part 5 and an analysis detection part 6; wherein, the temperature control part 2 is a temperature-controlled sample chamber provided with two light holes (201 and 202), the light hole 201 is facing the light output side of the light source 1, the light hole 202 is facing the light incident side of the spectral detection part 5, and the analysis and detection part 6 is connected to the spectrum detection part 5, and the two electrodes of the power supply 4 are respectively connected to the sample 3 to be tested.
[0086] Combine below figure 1 The spectr...
Embodiment 2
[0089] The light source 1 in Example 1 is a xenon lamp, a monochromator is set on the light output side of the light source 1, the sample 3 to be tested is located on the light output side of the monochromator, the power supply is an adjustable DC power supply, and the temperature control unit 2 is a temperature control platform. The test sample 3 is placed on the temperature control part 2, the spectral detection part 5 is located on the light-emitting side of the test sample 3, and the test sample 3 adopts tetragonal phase Yb:PMN-PT (ytterbium doped [(1-x)Pb(Mg 1 / 3 Nb 2 / 3 )O 3 -xPbTiO 3 ) ferroelectric crystal. Below in conjunction with the device of this embodiment 2, the spectral detection method of the ferroelectric crystal structure is described:
[0090] Step 1. Use an X-ray diffractometer to carry out crystallographic orientation on the sample to be tested, and cut the crystal according to the orientation of [001] to obtain a sheet-shaped sample with a size of 5mm...
Embodiment 3
[0096] The sample 3 to be tested in Example 3 is a tetragonal Yb:PMN-PT ferroelectric crystal obtained by cutting the crystal according to the [110] orientation, and other steps are the same as in Example 2.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com