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Single exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation

A technology of wavefront reconstruction and dynamic modulation, applied in measurement devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of inability to perform multiple scans and inapplicability, and achieve single exposure measurement, easy Effect of design and processing, broad flexibility

Active Publication Date: 2020-07-31
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in many cases, the application conditions determine that multiple scans cannot be performed, such as on-line measurement of pulsed lasers, or imaging of biological samples that are vulnerable to X-ray damage. Multiple scans are not applicable, so single exposure Measurement still has a broad demand base, and it is urgent to develop a single-exposure phase recovery device and algorithm with fast convergence capabilities

Method used

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  • Single exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation
  • Single exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation
  • Single exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation

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Embodiment 1

[0040] A design scheme for a wavefront modulator, such as figure 2 As shown, it is a phase-only binary wavefront modulator with an amplitude transmittance of 1, a phase delay of 0 or π, and a minimum element size of 1 micron×1 micron. Its spectral distribution is divisible and can be divided into Multiple different sub-spectrums.

Embodiment 2

[0042] A design scheme for a wavefront modulator, such as image 3 As shown, it is a pure-phase binary wavefront modulator with an amplitude transmittance of 1, a phase delay of 0 or π / 4, and a minimum cell size of 5 microns × 5 microns. Its spectral distribution is divisible and can be split into a number of different sub-spectrums.

Embodiment 3

[0044] A design scheme for a wavefront modulator, such as Figure 4 As shown, it is an amplitude-phase binary wavefront modulator, the amplitude transmittance is 1 or 0, the phase delay is 0 or π, the minimum element size of the amplitude and phase is 2 microns × 2 microns, and its spectral distribution can be Divisibility, which can be divided into multiple different sub-spectrums.

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Abstract

The invention discloses a single exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation. After a to-be-measured light beam passes through the specially designed wavefront modulator, diffraction light spots of the wavefront modulator have divisibility. Meanwhile, the frequency spectrum of the wavefront modulator also has divisibility, equivalently, multiple diffraction light spots are obtained after a light beam to be measured passes through multiple different wavefront modulators, complex amplitude distribution of the wavefront to be measured can be obtained through rapid reconstruction by means of a matching iterative algorithm, and finally wavefront reconstruction and phase imaging under single exposure are achieved.

Description

technical field [0001] The invention relates to wavefront phase recovery, in particular to a single-exposure wavefront reconstruction and phase imaging device and method based on dynamic modulation. Background technique [0002] Phase information measurement plays an extremely important role in the fields of imaging and measurement. However, since the phase distribution cannot be directly measured at present, it can only be realized by indirect measurement. Using the recorded diffraction spot intensity information, coherent diffraction imaging (CDI, coherent diffractive imaging) (J.M.Rodenburg, "Ptychography and Related Diffractive Imaging Methods," in Advances in Imaging and ElectronPhysics, Hawkes, ed. (Elsevier, 2008), pp.87-184.) can reconstruct the lost phase information through iterative calculations, Realize the phase recovery of the diffraction spot, combined with the intensity information obtained from the recording, and then obtain the complete complex amplitude di...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/041
CPCG01N23/041
Inventor 潘兴臣刘诚朱健强
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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