X-ray detector structure and working method thereof

Abstract

The invention discloses an X-ray detector structure and a working method thereof. The X-ray detector structure comprises a detector chip, a front scintillator, a back scintillator, a substrate and a fixing structure, wherein the detector chip comprises a front incident plane and a back incident plane; the photosensitive area of the front incident surface is attached to the front scintillator, andthe photosensitive area of the back incident surface is attached to the back scintillator; the non-photosensitive area of the detector chip is attached to the substrate; and one end or two ends of thedetector chip is / are provided with a signal transmission area which is conducted to the substrate through binding wires. According to the X-ray detector structure and the working method thereof, thestructural design is reasonable, and the working method is simple; a double-sided incidence mode is adopted, so that the thickness of the whole scintillator of the X-ray detector is increased, and meanwhile, the light output of the scintillator is not reduced; and the area of the detector chip is not increased, the signal magnitude is ensured, the imaging quality is improved, and the application prospect is wide.

Description

technical field [0001] The invention relates to the technical field of X-ray detectors, in particular to an X-ray detector structure and a working method thereof. Background technique [0002] An X-ray detector is a device that converts X-ray energy into electrical signals that can be recorded. It is usually composed of a scintillator, a detector chip, and a substrate, such as figure 1 As shown, the working principle is that X photons are incident into the scintillator, converted into visible light output, and enter the detector chip. Then the photoelectric conversion is performed by the detector chip to form an electrical signal, which is transmitted to the subsequent signal processing chip through the wires on the chip and the substrate to form the final image. [0003] According to the direction of the incident light, the detector chip is divided into two types: front entry type and back entry type, such as figure 2 As shown, in the front-type detector chip, the visibl...

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Problems solved by technology

[0005] However, a thicker scintillator will bring some problems: First, as the thickness of the scintillator increases, the visible light absorbed by X-rays needs a longer path to be transmitted to the surface of the detector chip, while the visible light transmission In the process, it may be absorbed

[0007] The Chinese patent application No. CN201910706450.5 discloses an X-ray detector and its preparation method. The first photosensitive layer and the second photosensitive layer arranged on both sides of the scintillator layer are independently coupled and sampled, and the low-radiation Under the single exposure condition of the dose, the spatial resolution and the fluorescence absorption rate are improved at the same time, the radiation dose and the signal-to-noise ratio are optimized, and the problems such as the decrease of the light output caused by the increase of the thickness of the scintillator and the damage caused by the large mass are not solved.

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