X-ray free electron laser monopulse damage-resistant wavefront detection and correction system

Abstract

The invention provides an X-ray free electron laser monopulse damage-resistant wavefront detection and correction system. On the one hand, monopulse wavefront information is obtained under the condition that damage is reduced, and on the other hand, posture and surface type adjustment is conducted by measuring multi-pulse wavefront and feeding back the multi-pulse wavefront to a reflector, so thatthe debugging speed is increased, and the light beam focusing quality is improved.

Description

technical field [0001] The invention relates to an X-ray free electron laser single-pulse damage-resistant wave front detection and wave front correction system. Background technique [0002] X-ray free-electron laser (XFEL) has the characteristics of high brightness, high coherence, and ultrashort pulse, and is a powerful tool for basic scientific research. But taking full advantage of these features requires near-perfect optics and high-precision adjustment capabilities. Using the combination of wavefront detectors and adaptive optics to achieve wavefront correction is a commonly used solution in the fields of astronomy and aerospace in visible light, infrared and other wave bands. However, there are several problems with the combination of wavefront detectors and adaptive optics in X-ray free electron lasers: [0003] 1. In the soft X-ray band, the wavefront detector can use Hartmann wavefront detector to measure the wavefront. However, the Hartmann wavefront detector ...

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Problems solved by technology

However, the Hartmann wavefront detector is limited by the contradiction between the microhole period and diffraction, and requires a large spot to increase the sampling rate of the wavefront. This requires a space of more than 5m or even 10m in actual use, and the actual operation is very inconvenient.

Another method is the Talbot shearing interferometer, which uses absorption gratings in the soft X-ray band. At this time, the X-ray CCD detection pattern for direct detection is used. Because the pixel size is too large, it is not suitable for direct use, and it will also be damaged by too strong light. CCD

[0004] 2. In the hard X-ray band, the wavefront detector also uses a Talbot shearing interferometer, and the grating used at this time is a phase grating. At this time, there are also problems of directly detecting the CCD pixel size and CCD damage

[0006] 4. If piezoelectric ceramics are used as the drive of the X-ray reflector, and the X-ray reflectors work under ultra-high vacuum conditions, micro-deformation devices such as piezoelectric ceramics are used at this time, and there are problems in bonding with optical components.

There is a huge contradiction between multi-pulse accumulation and single-pulse testing

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