X-ray free electron laser monopulse damage-resistant wavefront detection and correction system
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANGHAI TECH UNIV
- Publication Date
- 2020-08-21
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Abstract
Description
technical field
[0001] The invention relates to an X-ray free electron laser single-pulse damage-resistant wave front detection and wave front correction system. Background technique
[0002] X-ray free-electron laser (XFEL) has the characteristics of high brightness, high coherence, and ultrashort pulse, and is a powerful tool for basic scientific research. But taking full advantage of these features requires near-perfect optics and high-precision adjustment capabilities. Using the combination of wavefront detectors and adaptive optics to achieve wavefront correction is a commonly used solution in the fields of astronomy and aerospace in visible light, infrared and other wave bands. However, there are several problems with the combination of wavefront detectors and adaptive optics in X-ray free electron lasers:
[0003] 1. In the soft X-ray band, the wavefront detector can use Hartmann wavefront detector to measure the wavefront. However, the Hartmann wavefront detector ...