Reliability recognition method, device and equipment for satellite electronic product and storage medium

Abstract

The embodiment of the invention discloses a reliability recognition method, device and equipment for a satellite electronic product and a storage medium. The reliability recognition method comprises the following steps: determining average fault interval time MTBF of the satellite electronic product and a judgment rule of the MTBF on the basis of a reliability index of the satellite electronic product; acquiring environmental stress data of the satellite electronic product during in-orbit operation, and determining an acceleration test stress model and an acceleration factor of the acceleration test stress model according to the environmental stress data; and determining acceleration test time under different confidence coefficients and different numbers of fault parts of the satellite electronic product based on the judgment rule and the acceleration factor, and performing an acceleration reliability recognition test on the satellite electronic product according to the acceleration test time. According to the embodiment, the reliability index of the satellite electronic product can be accurately evaluated within a short test time, the test time and cost are saved, and the productdevelopment period is shortened.

Description

technical field [0001] The invention relates to the field of reliability identification. More specifically, it relates to a reliability identification method, device, equipment and storage medium for the reliability of satellite electronic products. Background technique [0002] In 2018, there were 44 launches involving small satellites in the world, with a total of 322, accounting for 69% of the total number of global satellite launches, but only 4% of the total mass. Euroconsult predicts that the five-year growth rate of small satellites will reach a peak of 48% in 2024. From 2019 to 2028, more than tens of thousands of small satellites are expected to be launched worldwide. Compared with the traditional large satellites of several tons and above, small satellites have the advantages of small size, light weight, low manufacturing cost, flexible launch, multiple launches at a time, and damage to one or several satellites will not cause the entire system to fail. . Theref...

AI Technical Summary

Problems solved by technology

However, with the development of science and technology, the reliability level of electronic products is developing rapidly. At present, most satellite electronic equipment products require an on-orbit operation reliability of more than 0.95 (equivalent to mean time between failures (MTBF) Up to hundreds of thousands of hours or more), no matter which test method is selected for reliability identification, the test time of several times the product MTBF is required, which makes the product development unit unbearable in terms of product development cycle and product test cost investment

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