A method and system suitable for approximate calculation circuit reliability analysis
An analysis method and approximate calculation technology, applied in CAD circuit design, electrical digital data processing, special data processing applications, etc., to achieve the effect of increasing the scale of applicable circuits
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Embodiment 1
[0042] refer to Figure 1 ~ Figure 4 , which is the first embodiment of the present invention, this embodiment provides a method for analyzing circuit reliability applicable to approximate calculations, including:
[0043] S1: Construct correlation vectors based on the basic topology in the circuit.
[0044] It should be noted that the basic topology is a connection structure composed of fan-out, NOT gate, AND gate, OR gate, and XOR gate.
[0045] Specifically, the construction steps of the correlation vector are as follows:
[0046] For a pair of signal terminals (i, j) in the approximate calculation circuit, the correlation vector is defined as follows:
[0047] cv i,j =[C i=0,j=0, C i=0,j=1 ,C i=1,j=0 ,C i=1,j=1 ]
[0048] where C i=0,j=0 , C i=0,j=1 , C i=1,j=0 , C i=1,j=1 For i, j corresponds to the correlation coefficient of various signal combinations.
[0049] For all 2-input basic gates, the correlation coefficient at the output terminal can be derived fr...
Embodiment 2
[0120] refer to Figure 5 ~ Figure 6 , which is the second embodiment of the present invention, this embodiment is different from the first embodiment in that it provides a circuit reliability analysis system suitable for approximate calculation, including:
[0121] The vector module 100 is used for constructing the correlation vector, and the correlation vector at the output terminal is derived from the input signal probability and the correlation vector at the input terminal.
[0122] The dot product module 200 is connected with the vector module 100, and it is used to do the dot product calculation of the relevant vector and the tensor product of the probability of occurrence of the corresponding decimal input vector and the output probability to obtain the input probability matrix of the basic gate; then through the input terminal The tensor product of the input reliability matrices of IN1 and IN2 is used to calculate the input reliability matrix of the gate, and the ideal...
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