Baffle-free infrared temperature measurement method based on detector temperature drift model

Abstract

The invention belongs to the technical field of infrared imaging temperature measurement, and particularly relates to a baffle-free infrared temperature measurement method based on a detector temperature drift model. Calibration is carried out by adopting a close-range extension source method, a fitting curve method based on an infrared radiation law model is adopted in the aspect of data processing, meanwhile, in order to improve the measurement precision, segmented fitting is adopted, and a detector temperature drift model is provided to eliminate the influence of environmental radiation andinfrared detector target surface temperature factors on the temperature measurement precision and stability. A detector is placed in a constant temperature box, the ambient temperature of the detector is adjusted, black body images under different lens cone temperatures and detector target surface temperatures are obtained, and a temperature and target surface temperature gray scale change curveof each pixel lens cone is established. Then, the temperature of the black body is changed, close-range expansion source calibration is carried out, and a baffle-free infrared temperature measurementmethod based on a detector temperature drift model is provided according to a physical model.

Description

technical field [0001] The invention belongs to the technical field of infrared imaging temperature measurement, and in particular relates to an infrared temperature measurement method based on a detector temperature drift model. Background technique [0002] All objects in nature with a temperature above absolute zero radiate infrared rays all the time. Infrared temperature measurement is to use the thermal radiation of the object itself in the scene to perform infrared imaging on the target and display the temperature. With the development of industry, agriculture, national defense, and medicine, the requirements for temperature measurement are getting higher and higher. Such as measuring the temperature of mechanical equipment, electrical equipment, production equipment, etc. under the condition of starting up, and measuring the temperature of products in the production process or in the warehouse without causing pollution or damage to the products. Under the current si...

AI Technical Summary

Problems solved by technology

[0011] The current curve fitting method adopts global fitting, and the fitting error will be large for the region of interest and the scene with a relatively large temperature dynamic range, which seriously affects the improvement of temperature measurement accuracy

However, the look-up table method must establish enough sample points to obtain high accuracy. It is difficult to establish a sample database and takes a long time. Especially when the temperature measurement range is relatively wide, the calibration cycle will be very long and increase Factors such as the time cost and labor cost of actually producing the product

[0012] In order to reduce the impact of ambient temperature on image temperature measurement, shutters or baffles are often introduced in the existing technology, which undoubtedly occupies the space of the imaging system, making it difficult to design light and small mechanical structures of the imaging temperature measurement system, and also increases the imaging temperature. Circuit complexity of temperature measurement system

In addition, opening and closing the shutter block for a long time will not only cause a certain degree of wear on the surface of the detector, but also easily cause damage to the mechanical structure when used in a violent vibration environment

[0013] In order to reduce the influence of the target surface temperature of the infrared detector on the image temperature measurement, the existing technology often introduces temperature control circuits such as TEC, which will increase the power consumption of the instrument, especially in scenes with severe temperature changes, which will greatly increase the infrared temperature. The power consumption of the thermal imager restricts the practical application range of infrared temperature measurement, which is not conducive to the multi-field promotion of infrared temperature measurement

Images