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A calibration method for y-waveguide reflection characteristic test

A calibration method and technology of reflection characteristics, which are used in optical instrument testing, machine/structural component testing, testing optical fiber/optical waveguide equipment, etc., can solve the problem of Y-waveguide chip reflection intensity calibration, Y-waveguide calibration accuracy loss influence, and large loss and other problems to achieve the effect of saving test time, improving test efficiency and convenient operation

Active Publication Date: 2022-06-21
HARBIN ENG UNIV
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Problems solved by technology

Because the Y waveguide integrates the polarizing function, the loss is relatively large (generally greater than 3dB), so the calibration accuracy of the Y waveguide will be affected by the loss. Until now, there is no better way to accurately measure the reflection intensity of the Y waveguide chip. Calibration, this patent proposes a new type of calibration device constructed with a coupler and a variable attenuator to calibrate the Y-waveguide test results of the low-coherence reflectometer. By adjusting the loss value of the variable attenuator, high-precision calibration can be achieved And the calibration and testing can be carried out at the same time, which not only improves the testing efficiency but also ensures the calibration accuracy

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  • A calibration method for y-waveguide reflection characteristic test
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Embodiment Construction

[0046] The present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.

[0047] A calibration for Y-waveguide reflection characteristic test, the steps are as follows:

[0048] 1) It can be known from step (601) that the calibration device 20 is manufactured according to the manufacturing method of the calibration device, and the insertion loss of the calibration device 20 is debugged.

[0049] 2) It can be known from step (602) that the Y-waveguide 204 is connected to the calibration device 20 in a forward manner.

[0050] 3) It can be seen from step (603) that the low-coherence reflectometer 500 is connected to a matching length optical fiber 501, a variable attenuator 3 502 and a polarization state controller 503 with an appropriate length, and the calibration device 20 is connected to Low coherence reflectometer 500.

[0051] 4) Step (604) shows that the low-coherence reflectometer 500 is activated to ...

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Abstract

The invention provides a calibration method for testing the reflection characteristics of a Y waveguide, including an implemented device structure and a calibration method flow. The implementation plan is to use a 3dB coupler and a variable attenuator to build a calibration device, and to improve the calibration accuracy of the Y waveguide reflection characteristic test results by adjusting the loss of the calibration device, and to realize the simultaneous testing and calibration. The patent establishes a calibration device and method for the test results of the internal reflection characteristics of the Y-waveguide device, which can calibrate the reflectivity of the existing Y-waveguide internal chips and coupling points.

Description

technical field [0001] The invention relates to a calibration method for measuring the reflection characteristic of a Y-waveguide, and belongs to the technical field of polarization optical device measurement. Background technique [0002] Fiber optic gyroscope is a non-mechanical angular velocity measurement instrument based on the Sagnac effect invented in the 1970s. Among them, the Interferometric Fiber Optic Gyro (IFOG) has the characteristics of low cost, small size, light weight, low power consumption, etc., and it has fast startup, large dynamic range, strong anti-corrosion and noise ability, high sensitivity, and works well. Good stability and high reliability. The interferometric fiber optic gyroscope can accurately measure the angular velocity and angular acceleration of the object. According to the measurement results, the motion state, trajectory, travel direction and other information of the object can be obtained through calculation, so it is widely used in ae...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/00
CPCG01M11/31
Inventor 杨军张翔党凡阳朱云龙林蹉富张浩亮苑勇贵苑立波
Owner HARBIN ENG UNIV
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