A calibration method for y-waveguide reflection characteristic test
A calibration method and technology of reflection characteristics, which are used in optical instrument testing, machine/structural component testing, testing optical fiber/optical waveguide equipment, etc., can solve the problem of Y-waveguide chip reflection intensity calibration, Y-waveguide calibration accuracy loss influence, and large loss and other problems to achieve the effect of saving test time, improving test efficiency and convenient operation
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[0046] The present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.
[0047] A calibration for Y-waveguide reflection characteristic test, the steps are as follows:
[0048] 1) It can be known from step (601) that the calibration device 20 is manufactured according to the manufacturing method of the calibration device, and the insertion loss of the calibration device 20 is debugged.
[0049] 2) It can be known from step (602) that the Y-waveguide 204 is connected to the calibration device 20 in a forward manner.
[0050] 3) It can be seen from step (603) that the low-coherence reflectometer 500 is connected to a matching length optical fiber 501, a variable attenuator 3 502 and a polarization state controller 503 with an appropriate length, and the calibration device 20 is connected to Low coherence reflectometer 500.
[0051] 4) Step (604) shows that the low-coherence reflectometer 500 is activated to ...
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