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Terahertz image resolution testing device

A testing device and resolution technology, applied in the field of terahertz image imaging, can solve the problems of only one or several metal resolution bars, poor effect, uneven radiation distribution of the emission source, etc., to achieve accurate resolution testing, The radiation intensity is uniform, the radiation intensity and the effect

Pending Publication Date: 2021-01-12
SHANGHAI HENGLIN OPTIC ELECTRIC CO LTD
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is a resolution test, and the metal resolution bar is directly used to block part of the terahertz wave for testing, and there are only one or several metal resolution bars, so it is impossible to fully evaluate the comprehensive resolution in different directions within the field of view. Here During the test, if the radiation intensity of the hot water is not enough, or the radiation intensity is high, so the radiation distribution of the emission source is uneven, or the resolution test line is not effective in blocking the terahertz wave, it will affect the detection effect of the terahertz resolution. Therefore, it is necessary to design a terahertz image resolution detection device with high and uniform radiation intensity

Method used

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Embodiment Construction

[0018] A resolution test device for terahertz images, see figure 2 , image 3 : It includes a vertical support 1, the upper part of the vertical support 1 is surrounded by a rectangular frame 2, one side of the rectangular frame 2 in the thickness direction is provided with a heating plate 3, and the central position of the rectangular frame 2 in the thickness direction is provided with a heat shield 4. The other side of the rectangular frame 2 in the thickness direction is provided with a resolution board 5, and the outer surface of the resolution board 5 is provided with a test line 6, and the heating board 3 is a constant temperature heating board with uniform and stable radiation.

[0019] The heat insulation board 4 adopts a material with a large specific heat capacity, specifically polystyrene board, rock wool board or rubber powder polystyrene particle insulation slurry board;

[0020] The heating plate 3 is specifically a ceramic heating plate, a silicon carbide heat...

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Abstract

The invention provides a terahertz image resolution testing device which ensures accurate resolution testing on a terahertz imaging system and is high and uniform in radiation intensity. The device comprises a vertical support, a rectangular frame is defined by the upper portion of the vertical support, a heating plate is arranged on one side of the rectangular frame in the thickness direction, aheat insulation plate is arranged in the center of the rectangular frame in the thickness direction, and a resolution plate is arranged on the other side of the rectangular frame in the thickness direction; and test lines are arranged on the outer surface of the resolution plate, and the heating plate is a constant-temperature heating plate which is uniform and stable in radiation.

Description

technical field [0001] The invention relates to the technical field of terahertz image imaging, in particular to a resolution test device for terahertz images. Background technique [0002] The image clarity of the terahertz imaging system needs to be detected and confirmed with a resolution detection device dedicated to the terahertz band. Existing detection devices, see figure 1 , which uses hot water as the terahertz background radiation, uses different widths of resolution test lines to block part of the terahertz background radiation, and the remaining radiation enters the terahertz imaging system, thereby obtaining images of the resolution test lines. At present, there is a resolution test, and the metal resolution bar is directly used to block part of the terahertz wave for testing, and there are only one or several metal resolution bars, so it is impossible to fully evaluate the comprehensive resolution in different directions within the field of view. Here During ...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/0257
Inventor 范伟亮袁毅李畅陈昊康少晨梁冰曹沛孙义兴侯树海
Owner SHANGHAI HENGLIN OPTIC ELECTRIC CO LTD