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Central slice alignment method for micro- and nano-CT projection data

A technology of projecting data and central slicing, which is applied in image data processing, complex mathematical operations, image analysis, etc., and can solve problems such as low computational efficiency, insufficient noise resistance, and slow convergence speed

Active Publication Date: 2022-02-15
俐玛精密测量技术(苏州)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the method of iterative reprojection can only correct the radial runout error, and the convergence speed becomes slow when the radial runout of some turntables changes sharply
The spatial domain registration method of the central slice is computationally intensive, resulting in low computational efficiency
Extracting the feature points of the projection data requires the projection data to have good contrast, otherwise there will be a large error
And nano-CT data, such as cellular data, often do not have good contrast, so the noise immunity of this method is insufficient

Method used

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  • Central slice alignment method for micro- and nano-CT projection data
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  • Central slice alignment method for micro- and nano-CT projection data

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Embodiment Construction

[0073] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0074] Such as Figure 1 to Figure 2 As shown, for ease of description, the following takes the central slice principle of a cuboid sample S as an example to illustrate the XYZ coordinate system of the embodiment of the present invention. One surface of the sample S is placed in the plane where the paper surface is located, and it is regarded as the XY plane , the X axis is perpendicular to the Y axis. Among them, the positive direction of the X-axis is sliced ​​to the center of the X-axis as shown in the figure L B The extension direction of , that is, the direction to the right in the paper. The upward direction of the Y-axis in the paper is referred to as "upward" hereinafter, and vice versa is referred to as "downward". The Z axis is perpendicular to the XY plane, the positive direction is the direction pointing to the inside of the paper, and ...

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Abstract

The invention discloses a method for aligning central slices of micro-nano CT projection data. The method includes the following steps: Step 1: Acquiring a sequence of projection images to be corrected of a sample under a projection angle is to obtain the first sequence of projection images to be corrected in the sequence of projection images to be corrected. Correct the projected image P A and the second projection image to be corrected P B , and obtain the first projection image to be corrected P A The corresponding first reference projection image P Astd and the second projected image P to be corrected B Corresponding to the second reference projection image P Bstd ; Step 2, the t-th projection image P to be corrected in the sequence of projection images to be corrected t (t=1,2,...,N A , t≠A, B) Rotate according to each angle in the preset search angle sequence to obtain a set of rotated projection image sequences and then compare them with the first reference projection image P Astd Frequency-domain matching correction for reprojection. The present invention can use adjacent matching to correct on the basis of iterative reprojection, thereby speeding up the iteration speed and improving the calculation efficiency.

Description

technical field [0001] The invention relates to the technical field of X-ray nano-CT, in particular to a central slice alignment method of micro-nano CT projection data. Background technique [0002] X-ray nano-CT technology refers to a three-dimensional imaging technology combined with X-ray perspective imaging technology and nano-microscope technology, and its spatial resolution can reach about 10 nanometers. It has a wide range of applications in the fields of life science, chemistry and material science. [0003] However, precisely because of the high-precision characteristics of nano-CT, nano-CT has high requirements for the accuracy of various components during operation. In practice, these requirements are often not met, which reduces the image quality of imaging, and thus makes it impossible for nano-CT to be large-scale. Widespread use. One of the more critical problems is the reduction of image resolution. During the operation of the turntable commonly used in na...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/14G06F17/18G06T7/38G06T7/262
CPCG06T7/38G06T7/262G06F17/18G06F17/14G06T2207/10116G06T2207/10081G06T2207/10061
Inventor 张慧滔徐文峰朱溢佞邓世沃赵星
Owner 俐玛精密测量技术(苏州)有限公司