Detection device for manufacturing cylindrical capacitor of discrete semiconductor device
A detection equipment and semiconductor technology, which is applied to the components of electrical measuring instruments, instruments, and measuring electronics. It can solve the problems of low detection accuracy, capacitance adjustment, and automatic detection, etc., and achieve the effect of avoiding large impacts.
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[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0029] see Figure 1-7 , a kind of testing equipment for the manufacture of cylindrical capacitors of semiconductor discrete devices, comprising a base 1, the middle part of the base 1 is fixedly connected with a fixed column 2, the upper part of the fixed column 2 is provided with a torsion spring 2, and the left part of the torsion spring 2 is provided with There is a detection needle 202, and a fixed disk 203 is arranged on the upper middle outside of the f...
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