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A module aging test method and system

An aging test and module technology, which is used in environmental/reliability testing, measuring electricity, measuring devices, etc., can solve the problems of large floor space and limited number of modules, reducing floor space and increasing the number of modules. number, the effect of improving transmission efficiency

Active Publication Date: 2021-04-06
WUHAN JINGCE ELECTRONICS GRP CO LTD +1
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  • Abstract
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Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a module aging test method and system to solve the problem that the equipment required in the aging test process of the existing display equipment has an excessively large footprint and can simultaneously Technical problem with limited number of modules involved in testing

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  • A module aging test method and system

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0035] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0036] The technical terms involved in this application are explained as follows:

[0037] MIPI Protocol: Mobile Industry Processor Interface, Mobile Industry Processor Interface, is an open standard for mobile application processors initiated by the MIPI Alliance.

[0038] Lane d...

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Abstract

The invention discloses a module aging test method and system. By setting a control command generating unit, a physical layer data sending unit and a signal assembling unit corresponding to a plurality of modules to be tested; One-to-one correspondence of channel gating instructions, parameter control instructions, voltage configuration instructions and test images of the modules to be tested, generating module operating voltage, power-on sequence, first package data packet and serialized second package for the corresponding channel The data packet is sent to the signal assembly unit, and it is integrated into multi-lane data and sent to the multi-lane interface of the corresponding module, thereby reducing the footprint of the equipment required for the aging test process of the display device and increasing the number of modules involved in the detection number.

Description

technical field [0001] The invention belongs to the technical field of module aging testing, and in particular relates to a module aging testing method and system. Background technique [0002] The module has a certain failure probability, and the relationship between the failure probability and the number of times of use conforms to the characteristics of the bathtub curve. The failure probability of the module is high at the beginning of use, and the failure probability is greatly reduced after a certain number of times of use, until it is close to or reaches its After the service life, the failure probability of the module will increase again. Generally, the aging test (Test During burn-in, TDBI) is used to accelerate the occurrence of module failure probability, and directly let it enter the product stabilization period to solve this problem. [0003] The aging lighting test based on the module is usually carried out during the trial production of the product or the bat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00G02F1/13G01R31/00
CPCG01R31/003G02F1/1309G09G3/006
Inventor 阳芬
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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