Manufacturing method of MOS control thyristor
A manufacturing method and thyristor technology, which is applied in the direction of thyristor, semiconductor/solid-state device manufacturing, electrical components, etc., can solve problems such as difficulty in accurately controlling device channel doping concentration and length, failure to meet pulse power and solid-state circuit breaker application requirements, etc. , to achieve the effects of easy popularization and utilization, high current rise rate, and low on-state voltage drop
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[0026] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0027] refer to figure 1 , the basic structure of the MOS control thyristor of the present invention is that the whole device is n - The drift region acts as a voltage-resistant layer, n - There is a p base area in the center above the drift region, and n areas are located on both sides of the p base area; an n area is set in the center above the p base area. + Cathode area, n + There are n body regions on both sides of the cathode region, and the n body regions on both sides and n + A p ++ source region; two p ++ The aluminum layer on the upper surface of the source region and the n + The aluminum layer on the upper surface of the cathode region is connected as a whole to form the cathode electrode K; the n region, p base region, n body region and part of the p region on both sides ++ A layer of gate oxide layer (i.e. SiO 2 Material ...
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