Testing device of IGBT driving circuit

Abstract

The invention relates to a testing device for an IGBT drive circuit, and belongs to the field of testing devices. The testing device comprises a control unit which comprises a single-chip microcomputer and is used for outputting a control signal, receiving a detection result and carrying out intelligent judgment; a toggle circuit which is used for controlling switching of an upper bridge detectionchannel and a lower bridge detection channel of the IGBT drive circuit according to a first control signal of the single chip microcomputer, wherein only one of the upper bridge detection channel andthe lower bridge detection channel is opened at the same time; an optocoupler isolation circuit which is used for receiving a second control signal of the single chip microcomputer and switching theupper bridge detection channel and the lower bridge detection channel between a high-voltage level and a low-voltage level according to on-off of the upper bridge detection channel and the lower bridge detection channel and the second control signal; a voltage detection circuit which is used for detecting the driving signal output by the IGBT driving circuit and feeding back a detection result tothe single-chip microcomputer. Functional testing of the double-channel IGBT driving circuit can be rapidly detected, and the problems that an IGBT testing device is complex in system, high in cost and inconvenient to move are solved.

Description

technical field [0001] The invention relates to a test device, in particular to a test device for an IGBT driving circuit. Background technique [0002] In the prior art, the frequency converters of many manufacturers adopt ABB original frequency converters for transformation, that is, the internal main control board, drive board, etc. are removed from the original frequency converters and assembled separately. With the continuous advancement of technology, many manufacturers have begun to redesign the IGBT drive circuit to meet the stringent requirements of shearer inverters for size reduction, enhanced vibration resistance, and power density. In view of the fact that IGBT is a key component in the inverter, the failure of IGBT drive will definitely cause serious consequences, so the test of IGBT drive circuit becomes particularly important. [0003] In the product development stage, high-power DC power supplies, signal generators, high-voltage differential probes, Rogowsk...

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned test device has the characteristics of complex system, high cost and inconvenient movement, and cannot well meet the requirements for functional testing of IGBT drive circuits during on-site installation and maintenance, and cannot quickly test the quality of IGBT drive products

At present, there is no relevant information on the on-site rapid test device suitable for IGBT drive circuits

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