Wearable medical product mainboard function testing device

Abstract

A wearable medical product mainboard function testing device provided by the invention is high in efficiency, ensures the testing quality and has no damage to the product quality. The device comprises a pin point switching assembly (1), a plurality of product test control assemblies (2), a common function control assembly (3), an upper computer (4), an electromechanical controller (5), a product positioning controller assembly (6), a power supply (7), a USB HUB (8), a network switch (9), a wireless module and a camera (10). Each group of test pin points provided by the pin point switching assembly is connected with a product to be tested. Each test needle point is connected with one product test control assembly, the other end of each product test control assembly is connected with the shared function control assembly, the USB HUB and the network switch, and the shared function control assembly is further connected with the network switch and the camera. The invention can be applied to the field of wearable medical equipment.

Description

technical field [0001] The invention relates to the field of wearable medical equipment, in particular to a main board function test device for wearable medical products. Background technique [0002] In order to improve the production qualification rate and production efficiency of wearable medical equipment, improve production quality, reduce the repair rate, and reduce production costs; it is necessary to perform necessary tests on the functions of wearable medical equipment before assembling the main board. In addition, the integration of various motherboards is getting higher and higher, and the size is getting smaller and smaller, especially wearable devices, which are smaller in size; thus bringing great difficulty to the inspection of the production process. Usually, the whole machine can only be tested after the assembly is completed, or a simple power-on test can be performed before assembly, or the test points can be drawn out through custom tools and tested manua...

AI Technical Summary

Problems solved by technology

[0003] But, in the above-mentioned mode of prior art, after main board is assembled as finished product, carry out whole machine test, if whole machine function is abnormal then need to dismantle machine maintenance or scrap, this has reduced production qualified rate greatly, has also increased production cost; A simple power-on test has limited detection functions and cannot detect most of the functions of the device; using a custom tool to switch out the motherboard test points and manually testing them one by one, it takes too long to test all the functions of the product, which is inefficient and easy Missed or false detection is not conducive to automatic production and quality control of the production process

Therefore, the existing technology seems to be more and more inapplicable for the function test of small and exquisite motherboards, and it is urgent to design a new solution that can solve the above problems to solve the problem.

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