High-integration-level pulse testing device

A pulse test, highly integrated technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as testing difficulties

Pending Publication Date: 2021-05-18
CSR ZHUZHOU ELECTRIC LOCOMOTIVE RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides a highly integrated pulse test device to solve the technical problem of difficult testing caused by the limitations of the test environment and equipment

Method used

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Examples

Experimental program
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Effect test

Embodiment 1

[0057] see figure 2, the highly integrated pulse test device of this embodiment includes: a switch combination unit, a level conversion device and a control circuit:

[0058] The level conversion device is used to convert the external DC power supply of a single voltage into a plurality of output power interfaces corresponding to different voltages, respectively supplying power to the switch combination unit and the control circuit;

[0059] A switch combination unit, used to input control circuits by selecting different switch states;

[0060] The control circuit is used to select, generate and output corresponding test pulses according to different input switch states, so as to perform low voltage logic, dead time, minimum pulse width, chopping and short circuit tests. During implementation, the test pulse generated by the control circuit is transmitted to the daughter board through an electrically connected PWM (Pulse width modulation, pulse width modulation) transmission...

Embodiment 2

[0081] see Figure 7 , the structure of the highly integrated pulse testing device of this embodiment is basically the same as that of Embodiment 1, with slightly different details.

[0082] The test device supplies power to the main board (control circuit + level shifting circuit) through a 24V external power supply. There are multiple level shifting devices on the main board to change the 24V power supply into three commonly used levels of 24V, 15V, and 5V for components. The board provides power, and the fault interface can also adapt to these 3 different fault levels. All PWM transmission ports and fault signal receiving ports (which can receive output signals in normal conditions and fault signals in fault conditions) have two modes: optical and electrical. The transmission circuits of electrical signals and optical signals are 12 channels, of which 6 channels are PWM transmission interface, 6 channels are fault feedback interfaces. And there is a switch combination uni...

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Abstract

The invention discloses a high-integration-level pulse testing device. The high-integration-level pulse testing device comprises a switch combination unit, a level conversion device and a control circuit, the level conversion device is used for converting an external single-voltage direct-current power supply into a plurality of output power interfaces corresponding to different voltages, and respectively supplying power to the switch combination unit and the control circuit; the switch combination unit is used for inputting the control circuit by selecting different switch states; and the control circuit is used for selectively generating and outputting corresponding test pulses according to different input switch states so as to carry out low-voltage logic, dead time, minimum pulse width, chopping and short-circuit tests. Different testing programs can be sent according to different switch combinations, and convenience is provided for field testing.

Description

technical field [0001] The invention relates to the testing field of power components, in particular to a highly integrated pulse testing device. Background technique [0002] The power component is the core component of the converter, mainly composed of high-power semiconductor components, capacitors, electrical connection devices, cooling devices, control and drive circuits. In order to ensure the normal operation of the power components, the power components need to carry out various high-voltage tests before leaving the factory or after changing the control program. Before the high-voltage test, the power components need to be subjected to a low-voltage test. The tests mainly include normal pulse test, narrow pulse test, and minimum pulse test. Width test and dead zone test etc. [0003] With the development of technology, the structural forms of power components are becoming more and more diverse, and the application environment is becoming more and more complex. There...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/28
CPCG01R31/00G01R1/28
Inventor 王晓年忻兰苑陈燕平朱武杨涛孙康康余开庆陈正文龚喆
Owner CSR ZHUZHOU ELECTRIC LOCOMOTIVE RES INST
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