Terahertz microwave interference array for measuring two-dimensional electron density profile based on time delay method
A two-dimensional electronic and microwave interference technology, applied in the field of terahertz microwave interference arrays, can solve problems such as different local electron density, and achieve the effects of low development cost and simple structure
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[0015] The specific implementation manners of the present invention will be further described below in conjunction with the drawings and technical solutions.
[0016] A terahertz microwave interference array for measuring two-dimensional electron density profiles based on the time delay method of the present invention consists of figure 1 and figure 2 As shown, it includes a crystal oscillator 1, a hexagonal device 2, a point frequency source 3, a terahertz frequency multiplier 4, an integrated unit 5, a microwave waveguide 6, a terahertz phased array antenna 7 and a central processing unit 8, wherein the integrated unit 5 includes a first dimmer 51 and a second dimmer 54, a first programmable microwave switch 52i and a second programmable microwave switch 52ii, a terahertz mixer 53, an amplifier 55, a wave detector 56 and a collector 57. Wherein the six output ports of the six-centimeter 2 are respectively marked as a, b, c, d, e, f; the two output ports of the first two-ce...
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