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A fast phase matching method, storage medium and three-dimensional measurement system

A phase-matching and three-dimensional measurement technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of time-consuming, slow phase matching process, affecting the accuracy of three-dimensional reconstruction, and achieve the effect of improving accuracy and efficiency and improving accuracy

Active Publication Date: 2022-06-21
TZTEK TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, phase matching generally searches for points with the same name on the epipolar line. If an optimized search strategy is not adopted, the matching of a single pixel will consume a lot of time, which makes the phase matching process of the entire image very slow and affects the overall 3D measurement. efficiency
In addition, there are often large errors in the phase matching points of integer pixels, which affects the accuracy of 3D reconstruction.

Method used

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  • A fast phase matching method, storage medium and three-dimensional measurement system
  • A fast phase matching method, storage medium and three-dimensional measurement system
  • A fast phase matching method, storage medium and three-dimensional measurement system

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no. 1 example

[0050] A fast phase matching method for three-dimensional measurement, the method performs phase matching on adjacent points based on gradient calculation and topological relationship, and the method includes the following steps:

[0051] Step 1. Obtain the absolute phase map of the reference plane and the surface of the object by solving the phase algorithm. At the same time, enter the system parameters of the camera and projector. That is, make a calibration file that matches the bit first.

[0052] Step 2. Traverse the absolute phase map of the object surface, take a certain pixel as the phase value to be matched, and determine whether it is the pixel point in the first column of the image. If yes, the search starting point is the same position of the reference plane phase map (the first column). ), otherwise the search starting point is the position of the phase matching point (adjacent point) of the previous pixel point. Determine the corresponding epipolar line equatio...

no. 2 example

[0072] The present invention also provides a computer-readable storage medium on which computer instructions are stored, and when the computer instructions are executed, the steps of the aforementioned method are performed. Wherein, for the method, please refer to the detailed introduction in the foregoing part, and details are not repeated here.

[0073] Those of ordinary skill in the art can understand that all or part of the steps in the methods of the above embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable storage medium, and the computer-readable medium includes permanent and Non-permanent, removable and non-removable media can be implemented by any method or technology for information storage. Information may be computer readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM...

no. 3 example

[0076] A fast phase-matched 3D measurement system, see Image 6 , the three-dimensional measurement system includes a computer 1, a camera 2 and a projector 3, the object to be measured 5 is arranged on a reference plane 4 and is located below the camera 2 and the projector 3, and the computer 1 is connected with the camera 2 and the projector 3 by telecommunication.

[0077] The computer 1 includes a pre-storage module, a relay storage module, an image processing module and an image output module.

[0078] Wherein, the grating fringe image with characteristic information and system parameters are stored in the pre-storage module, the grating fringe image is sent to the projector 3 for projection, and the system parameters are sent to the image processing module.

[0079] The system parameters can be obtained by using an existing calibration method, including internal parameters and external parameters, and a parameter matrix is ​​formed for the image processing module.

[00...

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Abstract

The invention provides a fast phase matching method, a storage medium and a three-dimensional measurement system. The method includes obtaining the absolute phase diagram of the reference plane and the surface of the object through a phase solution algorithm; traversing the absolute phase diagram of the surface of the object, taking a certain pixel point, according to Pixel coordinates determine the corresponding epipolar line equation, and obtain the epipolar line search range of the point with the same name on the reference phase map; rough search, obtain the approximate position of the matching point; fine search, obtain the exact integer pixel coordinates of the matching point; sub-pixel matching The interpolation calculation of the points obtains the sub-pixel bit-identical points; obtains the sub-pixel disparity map of the whole image, calculates the sub-pixel disparity, and then calculates the height information for 3D reconstruction. The method and system improve the precision of phase matching by calculating sub-pixel phase matching points, and at the same time greatly improve the efficiency of three-dimensional reconstruction.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement of light composition, in particular to a fast phase matching method, a storage medium and a three-dimensional measurement system. Background technique [0002] In the three-dimensional measurement of structured light by the phase shift method, it is often necessary to perform phase matching. Through phase matching, the point with the same name in the image is obtained, and the parallax is calculated from the point with the same name, so as to reconstruct the three-dimensional point cloud data. [0003] The general monocular structured light 3D measurement system model diagram is attached figure 1 , O c X c Y c Z c is the camera coordinate system, O p X p Y p Z p is the projector coordinate system, O c O p parallel to the reference plane, Ω w is the pre-calibrated reference plane, O is the optical axis of the projector and the reference plane Ω w The intersection point, P is...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/25
CPCG01B11/002G01B11/2527G01B11/254
Inventor 黄煜田乃鲁赵顺顺谷孝东曹葵康刘明星其他发明人请求不公开姓名
Owner TZTEK TECH