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TEM electrical sample rod with environment isolation and transfer functions

A transfer function, sample rod technology, applied in the direction of circuits, discharge tubes, electrical components, etc., can solve the problems of not having an inert atmosphere or vacuum protection function, changing material properties, etc., to reduce experimental costs, high protection, and easy to use Effect

Pending Publication Date: 2021-07-09
NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] When using probe-type TEM electrical sample holders to carry out research work, there are certain problems with materials that are sensitive to water, oxygen, etc.: such as halide perovskite materials, some lithium battery materials, especially lithium metal, high-nickel systems, silicon Materials such as substrates, even brief exposure to air, moisture, oxygen can significantly change the properties of these materials
The invention has both the in-situ testing function and the dual-axis tilting function, but the invention does not have the function of inert atmosphere or vacuum protection

Method used

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  • TEM electrical sample rod with environment isolation and transfer functions
  • TEM electrical sample rod with environment isolation and transfer functions
  • TEM electrical sample rod with environment isolation and transfer functions

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Embodiment Construction

[0032] Such as Figure 1-Figure 4 As shown, the TEM electrical sample rod with the function of environmental isolation and transfer includes an outer rod 1, an inner dial rod 3 placed inside the outer rod 1, and a coarse adjustment mechanism 2 located at one end of the inner rod 3; the outer rod 1 and the inner dial A vacuum inner sleeve rod 6 with a hollow structure is arranged between the rods 3, and one end of the vacuum inner sleeve rod 6 near the coarse adjustment mechanism 2 is provided with a telescopic knob mechanism 7, which is used to drive the vacuum inner sleeve rod 6 to do linear reciprocation in the outer sleeve rod 1 Movement; the other end of the vacuum inner sleeve rod 6 is provided with an environment-isolated telescopic box 8, and the other end of the inner lever 3 is provided with a movable probe 5 placed in the environment-isolated telescopic box 8, and the movable probe 5 is electrically The control system performs fine adjustments and electrical measurem...

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Abstract

The invention discloses a TEM electrical sample rod with environment isolation and transfer functions. The TEM electrical sample rod comprises an outer sleeve rod, an inner shifting rod arranged in the outer sleeve rod and a coarse adjustment mechanism arranged at one end of the inner shifting rod. A vacuum inner sleeve rod of a hollow structure is arranged between the outer sleeve rod and the inner shifting rod, and a telescopic knob mechanism is arranged at the end, close to the coarse adjustment mechanism, of the vacuum inner sleeve rod and used for driving the vacuum inner sleeve rod to do linear reciprocating motion in the outer sleeve rod. An environment isolation telescopic box is arranged at the other end of the vacuum inner sleeve rod, a movable probe arranged in the environment isolation telescopic box is arranged at the other end of the inner shifting rod, and the movable probe conducts fine adjustment and electrical measurement through an electrical control system. A sealing area is provided for a water-oxygen sensitive material, the sealing performance is good, and the sample protection degree is high; and meanwhile, the sample rod has relatively flexible control performance, the micro battery is quickly constructed through coarse adjustment and fine adjustment, the control precision is high, and the use is simple.

Description

technical field [0001] The invention relates to the technical field of transmission electron microscopy, in particular to a TEM electrical sample rod with the function of environment isolation transfer. Background technique [0002] Transmission Electron Microscope (TEM) uses the electron beam that passes through the sample to image, and is used to observe the microscopic morphology and defects inside the sample, and has the ability to resolve at the atomic scale. [0003] In recent years, the in-situ transmission electron microscope (in-situ TEM) technology has realized the in-situ observation of the change behavior of the material structure under different external fields such as heat, force, electricity, magnetism, and atmosphere, and then established the material "structure- directly related to performance. Among them, in-situ TEM technology, which can realize simultaneous electrical signal loading and structural observation of samples, has played an important role in t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/20H01J37/26
CPCH01J37/20H01J37/26
Inventor 陈国新卢焕明沈圣成于海涛柯培玲
Owner NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI