System-level simulation test environment construction method based on DDS

A system-level simulation and test environment technology, applied in the field of DDS-based system-level simulation test environment construction, can solve the problems of difficult fault recurrence and fault location, lack of system-level test environment, insufficient system-level test verification, etc. The effect of improving sufficiency

Active Publication Date: 2021-08-06
BEIJING INST OF COMP TECH & APPL
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a method for constructing a system-level simulation test environment based on DDS, which solves the lack of current system-lev

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  • System-level simulation test environment construction method based on DDS
  • System-level simulation test environment construction method based on DDS
  • System-level simulation test environment construction method based on DDS

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specific Embodiment approach

[0038] Another specific embodiment of a DDS-based system-level simulation test environment construction method of the present invention includes:

[0039] The first step, virtual target machine model packaging specifically includes:

[0040] First, analyze the structure of the real target machine to obtain information about the processor and external devices.

[0041] Secondly, the virtualized processor model and the virtual peripheral device model are constructed by using the instruction set simulation technology and the general peripheral device simulation technology.

[0042] Finally, the virtual target machine is encapsulated and connected to the distributed co-simulation framework based on DDS, providing data communication interface, control interface and time synchronization interface, including init (initialization), step (single-step operation), run (operation), stop (stop), transfer (transmission), heartbeat_signal (synchronous heartbeat signal), etc.

[0043] The s...

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Abstract

The invention relates to a system-level simulation test environment construction method based on DDS, which comprises the following steps: constructing an instruction set simulation model, and providing a virtual target machine model for a system-level simulation test environment in combination with a virtual peripheral equipment model; constructing a communication protocol simulator model based on a configurable communication protocol in a plug-in mode, and selecting functional components according to test requirements; defining a communication data object between the virtual target machine and the communication protocol simulator, packaging according to a data specification of the DDS, binding a data writer and a data reader, and covering all communication interface data between the virtual target machine and the communication protocol simulator; dynamically accessing the virtual target machine and the communication protocol simulator based on a DDS distributed co-simulation bus, establishing communication connection, binding the virtual target machine and the communication protocol simulator with a theme, and setting a communication mode for data exchange; carrying out multi-node time synchronization on the virtual target machine and the communication protocol simulator; carrying out system characteristic state acquisition and analysis.

Description

technical field [0001] The invention relates to embedded system development technology, in particular to a DDS-based method for constructing a system-level simulation test environment. Background technique [0002] In the process of developing high-reliability embedded systems, there are strict requirements for software testing, especially for complex embedded systems containing multiple software configuration items, which have higher requirements for the test environment, and the requirements for system-level testing are put forward. System-level testing The environment has become a key issue that needs to be urgently solved in the current system-level testing. [0003] The system-level test environment based on real objects or semi-physical objects is difficult to carry out fault injection, software dynamic execution statistics, and system feature state collection and analysis, which makes it difficult to find and locate software quality problems, and cannot meet the syste...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F11/36
CPCG06F30/20G06F11/3664
Inventor 孔祥炳付修峰安恒金玉川贾张涛李雅斯柴宇航
Owner BEIJING INST OF COMP TECH & APPL
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