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Three-dimensional frequency surface digitalization and model comparison method

A model, three-dimensional technology, applied in the field of digital inspection, can solve the problems of models that cannot measure the depth of micron level, can only measure holes, slow speed, etc., to make up for the low measurement accuracy.

Pending Publication Date: 2021-08-24
LASER RES INST OF SHANDONG ACAD OF SCI
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Problems solved by technology

[0002] At present, the improvement of the accuracy of the shape and size of the unit in the frequency selective surface is mainly to use the Hexagon three-coordinate measuring instrument to sample and take points, and then compare the difference with the design value. Although this method has high precision, it is slow. Not all points can be measured, only holes can be measured, and models with a depth of micron cannot be measured

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  • Three-dimensional frequency surface digitalization and model comparison method
  • Three-dimensional frequency surface digitalization and model comparison method
  • Three-dimensional frequency surface digitalization and model comparison method

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Embodiment Construction

[0065] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0066] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0067] Some embodiments of the present i...

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Abstract

The invention relates to the technical field of digital detection, in particular to a three-dimensional frequency surface digitization and model comparison method, which comprises the following steps of: S1, acquiring three-dimensional measurement point cloud data by using a three-dimensional measurement and three-dimensional reconstruction algorithm; s2, carrying out feature extraction; s3, carrying out CAD model data extraction; s4, carrying out point cloud matching; and S5, carrying out error calculation and display. The beneficial effects of the invention are that the method can achieve the direct detection of three-dimensional FSS form and position parameters, achieves the measurement of three-dimensional FFS spatial features through the high-precision size measurement of a two-dimensional image in combination with the spatial feature information of the three-dimensional structured light, and overcomes the defect of low measurement precision of the spatial features in a large-size range in the conventional measurement of the three-dimensional structured light.

Description

technical field [0001] The invention relates to the technical field of digital detection, in particular to a three-dimensional frequency surface digitization and model comparison method. Background technique [0002] At present, the improvement of the accuracy of the shape and size of the unit in the frequency selective surface is mainly to use the Hexagon three-coordinate measuring instrument to sample and take points, and then compare the difference with the design value. Although this method has high precision, it is slow. Not all points can be measured, only holes can be measured, and models with a depth of micron cannot be measured. [0003] FSS is a single-screen or multi-screen periodic array structure composed of a large number of passive resonant units, which is composed of periodically arranged metal patch units or periodically arranged aperture units on a metal screen. This surface can exhibit total reflection (patch type) or total transmission characteristics (a...

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Application Information

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IPC IPC(8): G06T17/20G06F30/10G06F30/23G01B11/25
CPCG06T17/205G06F30/10G06F30/23G01B11/254
Inventor 王晓飞范军鹏张晓磊
Owner LASER RES INST OF SHANDONG ACAD OF SCI
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