Current-induced spin polarization method for detecting hexagonal warping of Bi2Te3 surface state
A technology of spin polarization and surface state, applied in the field of spintronics, can solve problems such as current-induced spin polarization separation of difficult three-dimensional topological insulators, and achieve the effects of low cost, strong practicability and broad application prospects.
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[0041] The technical solution of the present invention will be specifically described below in conjunction with the accompanying drawings.
[0042] The present invention provides a detection Bi 2 Te 3 A method of current-induced spin polarization of surface state hexagonal warping, as figure 1 shown, including the following steps:
[0043] Step S1, growing three-dimensional topological insulator Bi on a suitable substrate 2 Te 3 Thin film, the thickness of the film is between a few nanometers and tens of nanometers;
[0044] The substrate used in this embodiment is the Si substrate of (111) crystal plane, adopting molecular beam epitaxy technology, the growth thickness is respectively the three-dimensional topological insulator Bi of 3nm, 7nm, 20nm 2 Te 3 film.
[0045] Step S2, in the three-dimensional topological insulator Bi 2 Te 3 Prepare a pair of rectangular electrodes on the film;
[0046] The electrodes prepared in this example are titanium gold electrodes: t...
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