Thin film transistor device and preparation method thereof
A thin-film transistor and device technology, which is applied in the field of thin-film transistor devices and their preparation, can solve problems affecting the stability of oxide semiconductor layers, and achieve the effect of preventing negative shift of threshold voltage and improving stability
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[0091] The present invention also provides a method for preparing an indium gallium zinc thin film transistor device, which includes:
[0092] S101, providing a substrate 1;
[0093] S102, depositing a first metal layer on the substrate 1, and patterning the first metal layer to form a gate 2;
[0094] S103, depositing a first protection layer 3 on the substrate 1 and the gate 2, wherein the first protection layer covers the gate;
[0095] S104, sequentially depositing an oxide and a second metal layer on the first protective layer 3, and patterning the second metal layer to form a second metal layer after the first patterning process, and then patterning the second metal layer patterning the oxide to form an oxide semiconductor layer 4;
[0096] S105. Deposit a third metal layer on the second metal layer after the first patterning treatment, and pattern the third metal layer to form a patterned third metal layer;
[0097] S106. Deposit an anode material on the patterned th...
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