Special-shaped double-end large-current test probe and processing technology thereof

Abstract

The invention relates to a special-shaped double-end large-current test probe and a processing technology thereof. The probe comprises a spring, a shaft core and a shaft core tube which is slidably sleeved on one end of the shaft core. The shaft core is sleeved with one end of the spring, the shaft core pipe is sleeved with the other end of the spring, spring stop pieces are arranged at the ends, away from each other, of the shaft core and the shaft core pipe correspondingly, a first needle head and a second needle head are arranged at the ends, away from each other, of the shaft core and the shaft core pipe correspondingly, and the second needle head is detachably connected with the shaft core pipe; the probe is simple in overall structure, excellent in conductive contact and capable of bearing large current, the situation that a spring is prone to being burnt out when the large current of a traditional probe is too large is eradicated through cooperation of the shaft core and the shaft core pipe, meanwhile, the machining precision and difficulty of the shaft core and the shaft core pipe are guaranteed, the machining difficulty is reduced, the production efficiency of products is further improved, and in addition, the needle head which is detachably arranged can be adapted to different application occasions, and flexibility and adaptability are extremely high.

Description

technical field [0001] The invention relates to the technical field of electronic components, in particular to a special-shaped double-headed high-current test probe and its processing technology. Background technique [0002] The test probe is a high-end precision link device, which is widely used in testing PCB circuit boards and FPC (printed circuits). It is mainly used as a precision probe for connection. It has been widely used in mobile phones, automobiles, medical and aerospace and other technical fields. [0003] When in use, the test probe is installed on the test fixture, one end of the test probe is connected to the output terminal (the output terminal refers to voltage, frequency, etc.), and the other end of the test probe is connected to the component under test before testing can be performed. During the test process, the requirements for the test probe are extremely high, but the existing probe design has limited output for overvoltage and frequency, and the ...

AI Technical Summary

Problems solved by technology

During the test process, the requirements for the test probe are extremely high, but the existing probe design has limited output for overvoltage and frequency, and the increase in voltage will cause the internal parts of the test probe to burn out, and the structure is not easy to process and the process is difficult The production efficiency and precision control of the probe cannot be guaranteed, and the adaptability and flexibility cannot meet the daily needs of production. Therefore, the present invention proposes a special-shaped double-headed high-current test probe and its processing technology to solve the above problems

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