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A thermal shock test method and test equipment for electronic structural parts

A technology of thermal shock test and electronic structure, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problems of aggravating material fatigue, anti-fatigue performance detection, low accuracy of test performance data, etc., to ensure circuit connection. , The effect of preventing the influence of high and low temperature environment

Active Publication Date: 2022-04-29
深圳市优瑞特检测技术有限公司
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Problems solved by technology

The utility model enlarges the temperature sudden change range of the temperature sensor through the high-temperature furnace and the air cooler, and increases the temperature change rate, thereby aggravating the material fatigue caused by the cold and heat impact, and increasing the number of tests per unit time through the driving mechanism, so as to shorten "Test cycle", but when the device conducts the thermal shock test, it only tests the fatigue resistance performance of the electronic structural parts material, and fails to detect whether the electronic structural parts continue to operate normally, resulting in relatively limited test results;
[0005] 2. The comparative document CN108469393A discloses a thermal shock test equipment, "comprising: a heating device and a cooling device, the heating device and the cooling device are connected through a pipeline, and the two ends of the pipeline extend to the inside of the heating device and the cooling device respectively, The pipeline is provided with a valve body to control its on-off, and a loading cylinder is slidably arranged inside the pipeline, and the loading cylinder is connected with a conveying mechanism that drives it to move back and forth to the heating device or the cooling device The cold and hot shock test equipment with the above structure uses pipelines to transport the loading cylinder for placing workpieces, and the connection between the heating device and the cooling device is cut off through the valve body, the cold and hot conversion process and the impact recovery time are short, and the test equipment is small in size and low in cost. , high energy utilization efficiency, and easy operation, thus providing a very cost-effective test equipment for small workpieces that need to be subjected to thermal shock tests.” However, the device failed to withstand heat during thermal shock tests During the test, the heat resistance performance of electronic structural parts was tested, resulting in incomplete test results;
It realizes fast switching between different temperature boundary conditions, and can accurately measure the opening and closing rate and changes of the thermostat", but the range of cold and heat shock inside the device's cold and heat shock chamber cannot realize multi-range switching, resulting in The thermal and thermal shock test range of the device is not comprehensive enough, and the data accuracy of the test performance is low

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  • A thermal shock test method and test equipment for electronic structural parts
  • A thermal shock test method and test equipment for electronic structural parts
  • A thermal shock test method and test equipment for electronic structural parts

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Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front end", "rear end", "both ends", "one end", "another end" The orientation or positional relationship indicated by etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that ...

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Abstract

The invention discloses a method and equipment for testing cold and heat shock of electronic structural parts, comprising a base plate and a No. block, the top of the slider is equipped with a turntable, the top of the turntable is installed with a pole, and the surface of the pole is equipped with two groups of symmetrically arranged electric telescopic rods, and the tail ends of the electric telescopic rods are screwed with A threaded rod, a placing frame is installed on the bottom of the threaded rod, and No. 1 test box and No. 2 test box are symmetrically arranged on the surface of the placement frame away from the electric telescopic rod. The present invention can detect and analyze the specific conditions of the performance of the electronic structural parts when they are subjected to the thermal shock test by setting the first test box and the second test box. The color change and precipitation formation can be used to judge the performance of electronic structural parts materials.

Description

technical field [0001] The invention relates to the technical field of thermal shock testing, in particular to a thermal shock testing method and testing equipment for electronic structural parts. Background technique [0002] In the process of rapid temperature changes, the damage to the product due to thermal expansion and contraction or other reasons is detected. This test is called thermal shock test. Through the thermal shock test, the electronic structural parts can be tested for sharp changes in the ambient temperature. It can be used to test the adaptability of electronic structural parts in the engineering development stage, and it can be used to find the design and process defects of electronic structural parts products, and it has important experimental significance for improving the electronic structural parts products and performance in the later stage. [0003] The defects of existing hot and cold shock testing equipment are: [0004] 1. The comparative docume...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 熊艳慧梅礼光陈勇李胜
Owner 深圳市优瑞特检测技术有限公司
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