goa circuit and its electrical aging test method
A kind of aging test and circuit technology, applied in the direction of electronic circuit test, measurement power, measurement device, etc., can solve the problem of poor stability of GOA circuit, and achieve the effect of reducing production cost, increasing production capacity and improving efficiency
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[0065] This embodiment provides a GOA circuit and an electrical aging test method thereof, including most of the technical features of Embodiment 1, the difference is that when the GOA circuit performs an electrical aging test, the first constant voltage low level is set The voltage difference between the voltage of the signal VSSQ and the second constant voltage low level signal VSSG is greater than 0, so that the first thin film transistor T11, the second thin film transistor T21 and the third thin film transistor T22 are electrically aged .
[0066] When the GOA circuit is subjected to an electrical aging test, when the first thin film transistor T11, the second thin film transistor T21 and the third thin film transistor T22 are all P-type thin film transistors, the first constant voltage low power The voltage difference between the voltage of the level signal VSSQ and the second constant-voltage low-level signal VSSG is greater than 0, which is mainly to make the thin film...
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