Multi-dimensional measurement method suitable for dark light environment

Abstract

In order to solve the problems in the prior art, the invention provides a multi-dimensional measurement method suitable for a dark light environment, and the method comprises the steps: S1, obtaining a virtual background measurement space through a rapid distance measurement device, and obtaining a background point cloud picture through an infrared projector and an infrared camera; S2, selecting a virtual measurement surface in the virtual background measurement space to form correction parameters. S3, obtaining a virtual measurement form of the to-be-measured target through the rapid distance measuring device, and complementing the virtual measurement form with the image contour of the to-be-measured target. S4, obtaining a virtual form of the to-be-measured target in the virtual background measurement space and on the virtual measurement surface. and S5, outputting required measurement data of the to-be-measured target according to the virtual form. According to the invention, accurate measurement in a dark light environment is realized, the measurement precision error is 0.04-0.7 cm, and the measurement and analysis time is prolonged to 0.01-0.001 second.

Description

technical field [0001] The invention relates to the field of intelligent measurement, in particular to a multi-dimensional measurement method suitable for dark light environments. Background technique [0002] Measurement is to use data to describe the observed phenomenon according to a certain law, that is, to make a quantitative description of things. The traditional measurement is to use a measuring device to physically measure the measurement target, and the measurement efficiency is low. In recent years, due to the continuous advancement of computer computing power and virtual model analysis technology, intelligent measurement of measurement targets based on image data acquired by cameras has become more and more measurement methods. However, the existing intelligent measurement can only measure distance and two-dimensional area with a single camera device. When it is necessary to output object shape data or three-dimensional data, at least three camera devices are req...

AI Technical Summary

Problems solved by technology

However, the existing intelligent measurement can only measure distance and two-dimensional area with a single camera device. When it is necessary to output object shape data or three-dimensional data, at least three camera devices are required to measure the measurement target from different angles. The required object shape data or three-dimensional data can only be formed after the mold

In particular, the existing technology often needs to rely on 3D point cloud technology and 3D modeling technology when obtaining object shape data. The amount of points collected and the amount of calculation of these two technologies are very large. Generally, a high-performance computer is required to complete it, and the device is complicated. And while the cost is high, due to the long calculation time, it is difficult to realize the application in the field of real-time measurement

[0003] In addition, the existing optical intelligence technology, which uses ordinary cameras as the basis of photography, can perform well in measurement under natural light conditions, but it basically cannot work in dark or dark environments, or the measurement data error is extremely large

Although the technology based on infrared structured light can effectively solve the problem of working status in dark or dark environments, the structured light measurement technology has the following problems in measuring targets in dark environments: 1. Existing Infrared structured light technology requires a large amount of data calculation, the general response time is 0.5-1 second, and the hardware equipment of the measuring device, especially the processor and processor cooling function are very demanding

2. The existing structured light has high accuracy when measuring the measurement target with a large difference between the color and the structured light color, but when measuring the measurement target with a small or consistent color difference with the structured light color, there will be significant measurement errors

3. The existing structured light has relatively strict requirements on the angle and distance between the measurement target and the equipment, because the existing structured light technology lacks effective identification and supplementary technology for the occluded surface of the measurement target

4. The existing structured light measurement technology generally requires the measurement target to be a single target. Otherwise, when the two-dimensional distorted images of multiple targets cross or overlap, the output three-dimensional contour of the target is the contour after the multi-target connection, which will inevitably lead to There are huge errors in the output morphological data and measurement data

5. The existing structured light measurement technology requires that the measurement surface must be smooth, single-colored, and without complex structures, otherwise it will greatly interfere with the analysis accuracy of structured light measurement and the speed of data analysis and output

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