Method for determining position of station causing surface defect of substrate glass
A glass surface and defect technology, applied in the field of substrate glass production and inspection, can solve problems such as unfavorable new employee training and independent employment, reduced personnel utilization, and employees can't remember, and achieves fast implementation, reduced labor intensity, and clear goals. Effect
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[0028] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the solutions of the present invention will be further described below. It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.
[0029] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here; obviously, the implementation in the description is only a part of the implementation of the present invention, rather than Full implementation.
[0030] Such as figure 1 As shown, the method for determining the position of the station that causes the surface defect of the substrate glass provided by the embodiment of the present invention includes the following steps:
[0031] Step S1, establishing a...
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