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Method for determining position of station causing surface defect of substrate glass

A glass surface and defect technology, applied in the field of substrate glass production and inspection, can solve problems such as unfavorable new employee training and independent employment, reduced personnel utilization, and employees can't remember, and achieves fast implementation, reduced labor intensity, and clear goals. Effect

Pending Publication Date: 2021-12-24
山西光兴光电科技有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Although this method can eventually eliminate defects, experienced employees cannot remember all the stations where defects are generated, and omissions or judgment errors may occur, which seriously reduces the maintenance speed, thereby reducing production efficiency. In addition, it is not conducive to The training and independent employment of new employees relies heavily on experienced employees, which reduces the utilization rate of personnel

Method used

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  • Method for determining position of station causing surface defect of substrate glass
  • Method for determining position of station causing surface defect of substrate glass
  • Method for determining position of station causing surface defect of substrate glass

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Embodiment Construction

[0028] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the solutions of the present invention will be further described below. It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0029] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here; obviously, the implementation in the description is only a part of the implementation of the present invention, rather than Full implementation.

[0030] Such as figure 1 As shown, the method for determining the position of the station that causes the surface defect of the substrate glass provided by the embodiment of the present invention includes the following steps:

[0031] Step S1, establishing a...

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PUM

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Abstract

The invention relates to the field of production and inspection of substrate glass, and discloses a method for judging the position of a station causing surface defects of the substrate glass. The method comprises the following steps: establishing a defect database of substrate glass; inputting the defect information of the substrate glass into the defect database to obtain substrate glass information which corresponds to the defect information and is stored in the defect database, and obtaining position information of a station causing the defect according to the substrate glass information. According to the method, the position information of the station causing the defect can be obtained only by inputting the defect information on the substrate glass into the defect database by a worker, the working efficiency is improved, and the method has the advantages of rapidness in implementation and operation, accurate and reliable result, good applicability and high practicability.

Description

technical field [0001] The invention relates to the field of substrate glass production inspection, in particular to a method for determining the position of a station that causes surface defects of the substrate glass. Background technique [0002] In the liquid crystal glass production technology, semi-finished glass needs to be reprocessed, and the processing procedures include: loading, scribing, breaking, grinding, cleaning, inspection, packaging, etc. During the working process, these processes must be in contact with a certain part of the glass surface, which may cause scratches, chip drop, wheel marks, suction cup marks and other defects. [0003] In actual production, when defects such as scratches, chip drops, wheel marks, and suction cup marks appear on the production line, experienced employees are generally relied on to judge the station where the defect occurred based on the type and location of the defect combined with past experience. Carry out maintenance o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06Q10/10G06F16/2457G06F16/248G06F16/25
CPCG06Q10/06311G06Q10/103G06F16/252G06F16/2457G06F16/248
Inventor 李青薛文明王俊明赵玉乐张志刚王赛刘公毅
Owner 山西光兴光电科技有限公司
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