X-ray beam position detector based on ion beam high-order ionization principle

Abstract

The invention relates to an X-ray beam position detector based on an ion beam high-order ionization principle. The X-ray beam position detector comprises an ion source, an ion accelerating electrode, an electromagnetic lens, a scanning device, an X-ray beam to be measured, a coupling lens, an ion valence analyzer and a time resolution monitoring control and data acquisition-processing system. The ion source is connected to the ion accelerating electrode, and the ion electrode is used for providing a electrode voltage of hundreds of eV-keV; the electromagnetic lens is arranged behind the ion accelerating electrode and is used for focusing an ion beam accelerated by the ion accelerating electrode, thereby improving the spatial resolution and separating out the low-valence ions; an ion beam scanning device is arranged behind the electromagnetic lens; the ion beam after passing through the scanning device scans and irradiates to the X-ray beam to be measured and is used for scanning the X-ray beam; and the ion beam passing through the X-ray beam to be measured is input into the ion valence analyzer for separating the ions which are ionized at high order and have scanned the X-ray beam.

Description

technical field [0001] The invention proposes a method for detecting the position of an X-ray beam aimed at high intensity / power density, which solves the problem that the existing position detector cannot bear high heat load and high background noise. Background technique [0002] With the development of scientific research, the demand for large scientific devices such as high-intensity X-ray light source devices such as free electron lasers and synchrotron radiation sources has become increasingly strong in recent years. The X-ray beam position detector is a key component of the beamline in the synchrotron radiation facility. It can provide real-time data on the position / angle, distribution and intensity of the beam. basic information. [0003] Traditional beam position detection devices include fluorescent targets, diamond electrodes, wire scans, ionization chambers, etc. [0004] (1) The solution based on the fluorescent screen is to convert X-rays into visible light w...

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Problems solved by technology

[0008] The above detection methods generally have several problems: (1) damage to the transmission of the beam, such as diamond four-quadrant, wire scanning; (2) cannot withstand the high thermal load of the undulator radiation, or even be destroyed, especially for High-energy light source, the power density on the optical axis is very high; (3) The spatial distribution of the undulator radiation will change with the adjustment of the gap parameter of the undulator, coupled with the background influence of the surrounding bending iron radiation, the surrounding radiation signal alone cannot Accurately measure the center position of the undulator radiation

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