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A method for sub-regional testing of lamp board fixtures

A test method and sub-area technology, applied in the field of sub-area testing of light board fixtures, can solve the problems of untestable, high test cost, high equipment cost, etc., and achieve the effect of shortening product delivery, reducing production cost, and improving production capacity

Active Publication Date: 2022-07-15
JIANGSU BOMIN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The above three fixture manufacturing methods can meet the requirements of most PCB products such as through-holes and HDI, but cannot meet the testing requirements of high-density light board products. The analysis is as follows:
[0007] (1) The light board product has the characteristics of large single PCS area, large number of PADs on the lamp bead surface, and high density. When the size of the light board product is large, it may exceed the equipment test area, resulting in failure to test; When it is small, the density of the PAD on the lamp bead surface will be relatively high, resulting in a large slope of the fixture, which exceeds the equipment process capability. Due to the limit requirements of the test machining area and the processing slope, the lamp board is in the area and density. It exceeds the capacity of the equipment, and conventional fixtures and equipment cannot meet the demand;
[0008] (2) Although the flying probe test can be used, the production capacity is too low to meet the demand for mass production, which increases the test cost; you can also purchase large-scale equipment or high-end matching products for production, but the cost of equipment will be high

Method used

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  • A method for sub-regional testing of lamp board fixtures
  • A method for sub-regional testing of lamp board fixtures
  • A method for sub-regional testing of lamp board fixtures

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Embodiment Construction

[0047] The technical solutions and beneficial effects of the present invention will be described in detail below with reference to the accompanying drawings.

[0048] like Figure 21 As shown in the figure, the present invention provides a sub-regional testing method for a lamp board fixture, the main principle of which is: figure 1 , figure 2 shown), make a jig according to 1:1 on the C side, and find the corresponding rules on the S side according to the network sorting, and split the layout, such as image 3 As shown in the figure, the S-surface lamp bead PAD is divided into 3 areas; finally, according to the split network, the test data of 3 partitions are produced respectively, and the test data of the 3 partitions are summarized and analyzed, and the fixture data is produced according to the analysis results. Then make a test fixture, and test different partitions after the fixture is completed. In this embodiment, one lamp panel can be tested three times to complete...

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Abstract

The invention discloses a method for sub-regional testing of a lamp board fixture, comprising the following steps: Step 1, based on the measurement point patterns on both sides of the lamp board to be tested, make a fixture for the C side according to 1:1, and search for the S side according to the network order. Rules, take the part with the same rules as a partition, and divide the S surface into N partitions; step 2, make test data corresponding to the N partitions, make a jig based on the test data, and use the jig to test different partitions respectively. The sub-regional testing method of the lamp board fixture can realize the test of high-density lamp board products, reduce the manufacturing cost of the fixture, and improve the test efficiency.

Description

technical field [0001] The invention relates to a sub-regional testing method for a lamp board fixture. Background technique [0002] Traditional test fixtures have three test methods: [0003] Method 1: After the printed circuit board is formed, the unit is set, and the fixture is made according to the set size of the circuit board at 1:1, and all the window PADs on the board are tested by needles; [0004] Method 2: After the printed circuit board is formed, the unit is set, and the fixture is made according to the size of the circuit board set at 1:1. The network is distinguished for all the window PADs on the board, and two or more sets of fixtures are made, respectively. carry out testing; [0005] Method 3: After the printed circuit board is formed, the unit is set. The set is composed of multiple pcs. The fixture is made according to single or multiple pcs. A set is tested multiple times according to the number of pcs to complete the whole set test. . [0006] The...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2812G01R31/282
Inventor 孙剑孙炳合孙守军韩肖郑军金敏
Owner JIANGSU BOMIN ELECTRONICS