A method for sub-regional testing of lamp board fixtures
A test method and sub-area technology, applied in the field of sub-area testing of light board fixtures, can solve the problems of untestable, high test cost, high equipment cost, etc., and achieve the effect of shortening product delivery, reducing production cost, and improving production capacity
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[0047] The technical solutions and beneficial effects of the present invention will be described in detail below with reference to the accompanying drawings.
[0048] like Figure 21 As shown in the figure, the present invention provides a sub-regional testing method for a lamp board fixture, the main principle of which is: figure 1 , figure 2 shown), make a jig according to 1:1 on the C side, and find the corresponding rules on the S side according to the network sorting, and split the layout, such as image 3 As shown in the figure, the S-surface lamp bead PAD is divided into 3 areas; finally, according to the split network, the test data of 3 partitions are produced respectively, and the test data of the 3 partitions are summarized and analyzed, and the fixture data is produced according to the analysis results. Then make a test fixture, and test different partitions after the fixture is completed. In this embodiment, one lamp panel can be tested three times to complete...
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